المؤلفون: Inaba, T., Oka, H., Asai, H., Fuketa, H., Iizuka, S., Kato, K., Shitakata, S., Fukuda, K., Mori, T.

المصدر: IEEE Access Access, IEEE. 12:12458-12464 2024

المؤلفون: Takumi Inaba, Hiroshi Oka, Hidehiro Asai, Hiroshi Fuketa, Shota Iizuka, Kimihiko Kato, Shunsuke Shitakata, Koichi Fukuda, Takahiro Mori

المصدر: IEEE Access, Vol 12, Pp 12458-12464 (2024)

مصطلحات موضوعية: Quantum computer, cryogenic temperature, Si spin qubit, short-channel MOSFET, random telegraph noise, band-tail state, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/10403918/; https://doaj.org/toc/2169-3536

URL الوصول: https://doaj.org/article/86a0341b30734716b05676159ca3cc5b

المؤلفون: Agarwal, Aditi, Han, Kijeong, Baliga, B. Jayant

المصدر: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), 2019 49th European. :78-81 Sep, 2019

Relation: ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC)

المؤلفون: Sharma, Baldeo Sharan, Bhat, M. S.

المصدر: 2017 International Conference on Innovations in Electronics, Signal Processing and Communication (IESC) Innovations in Electronics, Signal Processing and Communication (IESC), 2017 International Conference on. :1-4 Apr, 2017

Relation: 2017 International Conference on Innovations in Electronics, Signal Processing and Communication (IESC)

المؤلفون: Sarkar, Avijit Deb^Aff41

المساهمون: Angrisani, Leopoldo, Series Editor^Aff1, Arteaga, Marco, Series Editor^Aff2, Panigrahi, Bijaya Ketan, Series Editor^Aff3, Chakraborty, Samarjit, Series Editor^Aff4, Chen, Jiming, Series Editor^Aff5, Chen, Shanben, Series Editor^Aff6, Chen, Tan Kay, Series Editor^Aff7, Dillmann, Rüdiger, Series Editor^Aff8, Duan, Haibin, Series Editor^Aff9, Ferrari, Gianluigi, Series Editor^Aff10, Ferre, Manuel, Series Editor^Aff11, Hirche, Sandra, Series Editor^Aff12, Jabbari, Faryar, Series Editor^Aff13, Jia, Limin, Series Editor^Aff14, Kacprzyk, Janusz, Series Editor^Aff15, Khamis, Alaa, Series Editor^Aff16, Kroeger, Torsten, Series Editor^Aff17, Li, Yong, Series Editor^Aff18, Liang, Qilian, Series Editor^Aff19, Martín, Ferran, Series Editor^Aff20, Ming, Tan Cher, Series Editor^Aff21, Minker, Wolfgang, Series Editor^Aff22, Misra, Pradeep, Series Editor^Aff23, Möller, Sebastian, Series Editor^Aff24, Mukhopadhyay, Subhas, Series Editor^Aff25, Ning, Cun-Zheng, Series Editor^Aff26, Nishida, Toyoaki, Series Editor^Aff27, Oneto, Luca, Series Editor^Aff28, Pascucci, Federica, Series Editor^Aff29, Qin, Yong, Series Editor^Aff30, Seng, Gan Woon, Series Editor^Aff31, Speidel, Joachim, Series Editor^Aff32, Veiga, Germano, Series Editor^Aff33, Wu, Haitao, Series Editor^Aff34, Zamboni, Walter, Series Editor^Aff35, Zhang, Junjie James, Series Editor^Aff36, Dhawan, Amit, editor^Aff37, Mishra, R. A., editor^Aff38, Arya, Karm Veer, editor^Aff39, Zamarreño, Carlos Ruiz, editor^Aff40

المصدر: Advances in VLSI, Communication, and Signal Processing : Select Proceedings of VCAS 2021. 911:719-730

المؤلفون: Wang, Yujen, Tsao, Willy, Zeng, Zheng

المصدر: 2012 IEEE Radio Frequency Integrated Circuits Symposium Radio Frequency Integrated Circuits Symposium (RFIC), 2012 IEEE. :543-546 Jun, 2012

Relation: 2012 IEEE Radio Frequency Integrated Circuits Symposium (RFIC)

المؤلفون: Larson, J.M., Snyder, J.P.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(5):1048-1058 May, 2006

المؤلفون: Kyu-Il Lee, Chanho Lee, Hyungsoon Shin, Park, Y.J., Hong Shick Min

المصدر: IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst. Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on. 24(6):862-868 Jun, 2005

المؤلفون: Singh Yadav, Vimal Kumar, Baruah, Ratul Kr.

المصدر: 18th International Symposium on VLSI Design and Test VLSI Design and Test, 18th International Symposium on. :1-2 Jul, 2014

Relation: 2014 18th International Symposium on VLSI Design and Test (VDAT)

المؤلفون: Sun, Yanning, Kiewra, E. W., De Souza, J. P., Koester, S. J., Bucchignano, J. J., Ruiz, N., Fogel, K. E., Sadana, D. K., Shahidi, G. G., Fompeyrine, J., Webb, D. J., Sousa, M., Marchiori, C., Germann, R., Shiu, K. T.

المصدر: 2009 IEEE International Conference on IC Design and Technology IC Design and Technology, 2009. ICICDT '09. IEEE International Conference on. :161-164 May, 2009

Relation: 2009 IEEE International Conference on IC Design and Technology (ICICDT)