المؤلفون: Huo, S., Zhang, B., Muddassir, M., Chik, D.T.W., Navarro-Alarcon, D.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 22(3):2782-2792 Feb, 2022

المؤلفون: Wang, Zhenzhou

المصدر: 2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR) Lasers and Electro-Optics Pacific Rim (CLEO-PR), 2017 Conference on. :1-5 Jul, 2017

Relation: 2017 Conference on Lasers and Electro-Optics Pacific Rim (CLEO-PR)

المؤلفون: Arora, Chetan, Werman, Michael

المصدر: 2014 IEEE International Conference on Image Processing (ICIP) Image Processing (ICIP), 2014 IEEE International Conference on. :1977-1981 Oct, 2014

Relation: 2014 IEEE International Conference on Image Processing (ICIP)

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المؤلفون: Kammel, S., Leon, F.P.

المصدر: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference, 2005. IMTC 2005. Proceedings of the IEEE. 1:531-536 2005

Relation: 2005 IEEE Instrumentationand Measurement Technology Conference Proceedings

المؤلفون: Maestro-Watson, Daniel^Aff21, Balzategui, Julen^Aff21, Eciolaza, Luka^Aff21, Arana-Arexolaleiba, Nestor^Aff21

المساهمون: Kacprzyk, Janusz, Series Editor^Aff1, Pal, Nikhil R., Advisory Editor^Aff2, Bello Perez, Rafael, Advisory Editor^Aff3, Corchado, Emilio S., Advisory Editor^Aff4, Hagras, Hani, Advisory Editor^Aff5, Kóczy, László T., Advisory Editor^Aff6, Kreinovich, Vladik, Advisory Editor^Aff7, Lin, Chin-Teng, Advisory Editor^Aff8, Lu, Jie, Advisory Editor^Aff9, Melin, Patricia, Advisory Editor^Aff10, Nedjah, Nadia, Advisory Editor^Aff11, Nguyen, Ngoc Thanh, Advisory Editor^Aff12, Wang, Jun, Advisory Editor^Aff13, Graña, Manuel, editor^Aff14, López-Guede, José Manuel, editor^Aff15, Etxaniz, Oier, editor^Aff16, Herrero, Álvaro, editor^Aff17, Sáez, José Antonio, editor^Aff18, Quintián, Héctor, editor^Aff19, Corchado, Emilio, editor^Aff20

المصدر: International Joint Conference SOCO’18-CISIS’18-ICEUTE’18 : San Sebastián, Spain, June 6-8, 2018 Proceedings. 771:280-289

المؤلفون: Caulier, Yannick, Bourennane, Salah

المصدر: IEEE Transactions on Pattern Analysis and Machine Intelligence IEEE Trans. Pattern Anal. Mach. Intell. Pattern Analysis and Machine Intelligence, IEEE Transactions on. 32(11):2100-2105 Nov, 2010

المؤلفون: Kammel, S., Puente Leon, F.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 57(4):763-769 Apr, 2008

لا يتم عرض هذه النتيجة على الضيوف.
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تسجيل الدخول للوصول الكامل.