يعرض 1 - 10 نتائج من 1,099 نتيجة بحث عن '"step height"', وقت الاستعلام: 1.17s تنقيح النتائج
  1. 1
    مؤتمر
    Effect of Green Corrosion Inhibitors on the Performance of Copper-Cobalt CMP

    المؤلفون: He, Chao, Niu, Xinhuan, Yan, Han, Liu, Jianghao, Dong, Changxin, Li, Xinjie

    المصدر: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC) Science and Technology for Integrated Circuits (CSTIC), 2024 Conference of. :1-3 Mar, 2024

    Relation: 2024 Conference of Science and Technology for Integrated Circuits (CSTIC)

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  2. 2
    دورية أكاديمية
    Revealing the Impact of Gate Area Scaling on Charge Trapping Employing SiO2Transistors

    المؤلفون: Tselios, K., Knobloch, T., Waldhoer, D., Stampfer, B., Ioannidis, E., Enichlmair, H., Minixhofer, R., Grasser, T., Waltl, M.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):355-362 Sep, 2023

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  3. 3
    دورية أكاديمية
    Kinematic analysis-based comparative study and development of modified Theo Jansen linkage (MTJL)

    المؤلفون: Panchasara, Smit, Bharadia, Neel, Gajjar, Jyotin, Barot, Pratik, Bhavsar, KevalAff1, IDs12572024003729_cor5, Shah, Rushil, Parmar, Umang, Bhatt, Pina

    المصدر: International Journal of Advances in Engineering Sciences and Applied Mathematics. :1-9

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  4. 4
    مؤتمر
    Impact of Single Defects on NBTI and PBTI Recovery in SiO2 Transistors

    المؤلفون: Tselios, K., Knobloch, T., Michl, J., Waldhoer, D., Schleich, C., Ioannidis, E., Enichlmair, H., Minixhofer, R., Grasser, T., Waltl, M.

    المصدر: 2022 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2022 IEEE International. :1-5 Oct, 2022

    Relation: 2022 IEEE International Integrated Reliability Workshop (IIRW)

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  5. 5
    دورية أكاديمية
    Performance Optimization of Step-Like Divergence Plenum Air-Cooled Li-Ion Battery Thermal Management System Using Variable-Step-Height Configuration

    المؤلفون: Olanrewaju M. Oyewola, Adetokunbo A. Awonusi, Olawale S. Ismail

    المصدر: Emerging Science Journal, Vol 8, Iss 3, Pp 795-814 (2024)

    مصطلحات موضوعية: step-like plenum, step height, optimization, btms., Technology (General), T1-995, Social sciences (General), H1-99

    وصف الملف: electronic resource

    Relation: https://www.ijournalse.org/index.php/ESJ/article/view/2339; https://doaj.org/toc/2610-9182

    URL الوصول: https://doaj.org/article/9b4cecb88e8d49f6b04dfd6e65935d7a

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  6. 6
    مؤتمر
    Dishing Improve in Advanced Technology Nodes

    المؤلفون: Yang, Yu, Zhao, Wei, Xiao, Runcai, Li, Hu, Zhang, Jian, Zhou, Haifeng, Fang, Jingxun, Zhang, Yu

    المصدر: 2022 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2022 China. :1-3 Jun, 2022

    Relation: 2022 China Semiconductor Technology International Conference (CSTIC)

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  7. 7
    دورية أكاديمية
    Modeling of step height reduction with temperature function in copper CMP

    المؤلفون: Shin, Yeongil, Jeong, Jongmin, Park, Youngwook, Jeong, Seonho, Jung, Hokyoung, Jeong, HaedoAff1, IDs1220602324141_cor6

    المصدر: Journal of Mechanical Science and Technology. 37(12):6213-6220

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  8. 8
    دورية أكاديمية
    On the diversity‐based measures of equalness and evenness

    المؤلفون: Hans‐Rolf Gregorius, Elizabeth M. Gillet

    المصدر: Methods in Ecology and Evolution, Vol 15, Iss 3, Pp 583-589 (2024)

    مصطلحات موضوعية: concentration, diversity, equalness, evenness, step‐height distribution, stepladder, Ecology, QH540-549.5, Evolution, QH359-425

    وصف الملف: electronic resource

    Relation: https://doaj.org/toc/2041-210X

    URL الوصول: https://doaj.org/article/99d07378109b40e888dccca8c492e0c7

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  9. 9
    دورية أكاديمية
    A Cluster-Based Method for Quantitative Characterization and Uncertainty Evaluation of Areal Step Height in Structured Surface Metrology

    المؤلفون: Wang, C., Meng, X., Krolczyk, G., Wei, H.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 71:1-9 2022

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  10. 10
    مؤتمر
    Distribution of Step Heights of Electron and Hole Traps in SiON nMOS Transistors

    المؤلفون: Tselios, K., Stampfer, B., Michl, J., Ioannidis, E., Enichlmair, H., Waltl, M.

    المصدر: 2020 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2020 IEEE International. :1-6 Oct, 2020

    Relation: 2020 IEEE International Integrated Reliability Workshop (IIRW)

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