المؤلفون: Sofo-Haro, M., Donlon, K., Burke, B., Estrada, J., Fahim, F., Leitz, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(2):563-569 Feb, 2023

المؤلفون: Boukhayma, A., Kraxner, A., Caizzone, A., Yang, M., Bold, D., Enz, C.

المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 10:687-695 2022

المؤلفون: Chierchie, Fernando, Moroni, Guillermo Fernandez, Stefanazzi, Leandro, Chavez, Claudio, Paolini, Eduardo, Cancelo, Gustavo, Haro, Miguel Sofo, Tiffenberg, Javier, Estrada, Juan, Uemura, Sho

المصدر: 2021 Argentine Conference on Electronics (CAE) Electronics (CAE), 2021 Argentine Conference on. :82-87 Mar, 2021

Relation: 2021 Argentine Conference on Electronics (CAE)

المؤلفون: Boukhayma, A., Caizzone, A., Enz, C.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(6):880-883 Jun, 2020

المؤلفون: Kang, H., Ruan, B., Hao, Y., Chang, H.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 20(1):95-101 Jan, 2020

المؤلفون: Capoccia, Raffaele, Boukhayma, Assim, Enz, Christian

المصدر: 2017 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2017 IEEE International Symposium on. :1-4 May, 2017

Relation: 2017 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Capoccia, Raffaele, Boukhayma, Assim, Enz, Christian

المصدر: 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2016 IEEE International Conference on. :560-563 Dec, 2016

Relation: 2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS)

المؤلفون: Boukhayma, A., Peizerat, A., Enz, C.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 51(9):2180-2191 Sep, 2016

المؤلفون: Assim Boukhayma, Andrea Kraxner, Antonino Caizzone, Minhao Yang, Daniel Bold, Christian Enz

المصدر: IEEE Journal of the Electron Devices Society, Vol 10, Pp 687-695 (2022)

مصطلحات موضوعية: CMOS, 4T, CIS, conversion gain, sub-electron noise, wide dynamic, Electrical engineering. Electronics. Nuclear engineering, TK1-9971

وصف الملف: electronic resource

Relation: https://ieeexplore.ieee.org/document/9863855/; https://doaj.org/toc/2168-6734

URL الوصول: https://doaj.org/article/9697577a9cee45b3ab4f91d2c9f41838

المؤلفون: Wolfel, S., Herrmann, S., Lechner, P., Lutz, G., Porro, M., Richter, R. H., Struder, L., Treis, J.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 54(4):1311-1318 Aug, 2007