يعرض 1 - 10 نتائج من 54,568 نتيجة بحث عن '"tcad"', وقت الاستعلام: 0.84s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Investigation of Traps Impact on PAE and Linearity of AlGaN/GaN HEMTs Relying on a Combined TCAD–Compact Model Approach

    المؤلفون: Beleniotis, P., Zervos, C., Krause, S., Chevtchenko, S., Ritter, D., Rudolph, M.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(6):3582-3589 Jun, 2024

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  2. 2
    دورية أكاديمية
    Triple-layered nc-Si:H films improve electrical properties and expand process window of IBC-SHJ solar cells simulated by Silvaco TCAD
    Silvaco TCAD模拟应用三层氢化纳晶硅薄膜改善IBC-SHJ太阳电池的电学性能并扩大其工艺窗口

    المؤلفون: Jiang, KaiAff1, Aff2, Zhang, HonghuaAff1, Aff2, Zhang, LipingAff1, Aff2, Meng, FanyingAff1, Aff2, Gao, Yanfeng, Yu, Xiangrui, Zhao, Dongming, Li, Rui, Huang, Haiwei, Hao, Zhidan, Liu, ZhengxinAff1, Aff2, IDs408430232610y_cor11, Liu, WenzhuAff1, Aff2, IDs408430232610y_cor12

    المصدر: Science China Materials. 66(12):4891-4896

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  3. 3
    مؤتمر
    A TCAD to SPICE Framework for Isolation of BTI and HCD in GAA-SNS FETs and to Estimate Impact on RO Under Normal and Overclocking Conditions

    المؤلفون: Thakor, Karansingh, Chatterjee, Payel, Mahapatra, Souvik

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-6 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  4. 4
    مؤتمر
    A TCAD Framework for HCD in n-MOSFETs for PMIC Applications

    المؤلفون: Diwakar, Himanshu, Mahapatra, Souvik

    المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

    Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  5. 5
    دورية أكاديمية
    Investigation of the Performance Degradation of 4H-SiC Neutron Detectors Using MCNP and TCAD

    المؤلفون: Sun, Y., Hu, Z., Zhang, H., Gong, P., Zhong, G., Hu, L., Gorini, G., Croci, G., Tang, X.

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(4):4432-4441 Feb, 2024

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  6. 6
    دورية أكاديمية
    A Two-Prong Approach to the Simulation of DC-RSD: TCAD and SPICE

    المؤلفون: Croci, T., Menzio, L., Arcidiacono, R., Arneodo, M., Asenov, P., Cartiglia, N., Ferrero, M., Fondacci, A., Monaco, V., Morozzi, A., Moscatelli, F., Mulargia, R., Robutti, E., Sola, V., Passeri, D.

    المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 71(2):127-134 Feb, 2024

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  7. 7
    مؤتمر
    TCAD Investigation of AlGaN/AlN/GaN HEMT for Hydrogen Sensing Applications

    المؤلفون: Kumaran, Renuka, Rahul, J, Varghese, Arathy, Rajan, Lintu

    المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

    Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  8. 8
    دورية أكاديمية
    Characterization and TCAD Modeling of the Lateral Space Charge Accumulation in Epoxy Molding Compound in Packaged HV-ICs

    المؤلفون: Balestra, L., Gnani, E., Rossetti, M., Depetro, R., Reggiani, S.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2565-2569 Apr, 2024

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  9. 9
    مؤتمر
    Evaluating Performance Using kϕ Index Parameter for a Symmetrical Junction NADGFET: A 3D TCAD Simulation Analysis

    المؤلفون: Sinha, Arun Kumar, Naik, Banoth Vasu

    المصدر: 2023 International Conference on Next Generation Electronics (NEleX) Next Generation Electronics (NEleX), 2023 International Conference on. :1-5 Dec, 2023

    Relation: 2023 International Conference on Next Generation Electronics (NEleX)

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  10. 10
    مؤتمر
    3D X-DRAM: A Novel 3D NAND-like DRAM Cell and TCAD Simulations

    المؤلفون: Hsu, Fu-Chang, Huang, Richard J., Tsay, Re-Peng, Chang, Jui-Hsin, Chang, Chia-Haur, Huang, I-Wei, Hsu, Kevin

    المصدر: 2024 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2024 IEEE International. :1-4 May, 2024

    Relation: 2024 IEEE International Memory Workshop (IMW)

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