المؤلفون: Jiang, Weiqiang

المصدر: 2023 International Conference on Data Science and Network Security (ICDSNS) Data Science and Network Security (ICDSNS), 2023 International Conference on. :1-5 Jul, 2023

Relation: 2023 International Conference on Data Science and Network Security (ICDSNS)

المؤلفون: Xiong, Jiang, Chen, Huahui, Song, Yifeng

المصدر: 2023 12th Asia-Pacific International Conference on Lightning (APL) Lightning (APL), 2023 12th Asia-Pacific International Conference on. :1-4 Jun, 2023

Relation: 2023 12th Asia-Pacific International Conference on Lightning (APL)

المؤلفون: Yeh, Shih-Chun, Lee, Kuen-Jong, Chen, Dong-Yi

المصدر: 2022 IEEE 31st Asian Test Symposium (ATS) ATS Test Symposium (ATS), 2022 IEEE 31st Asian. :25-30 Nov, 2022

Relation: 2022 IEEE 31st Asian Test Symposium (ATS)

المؤلفون: Li, Taoyong, Shen, Zhijun, Du, Qinglin, Zhang, Jing, Zhang, Yuanxing

المصدر: 2022 4th International Conference on Artificial Intelligence and Advanced Manufacturing (AIAM) AIAM Artificial Intelligence and Advanced Manufacturing (AIAM), 2022 4th International Conference on. :523-527 Oct, 2022

Relation: 2022 4th International Conference on Artificial Intelligence and Advanced Manufacturing (AIAM)

المؤلفون: Schreiter, Sebastian, Lohmeyer, Holger, Werle, Peter

المصدر: 2021 IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM) Properties and Applications of Dielectric Materials (ICPADM), 2021 IEEE International Conference on the. :274-277 Jul, 2021

Relation: 2021 IEEE International Conference on the Properties and Applications of Dielectric Materials (ICPADM)

المؤلفون: Lee, K., Lu, Z., Yeh, S.

المصدر: IEEE Access Access, IEEE. 10:37603-37612 2022

المؤلفون: Munechika, Keiko, Chao, Weilun, Dhuey, Scott, Lacey, Ian, Pina-Hernandez, Carlos, Rochester, Simon, Yashchuk, Valeriy V

مصطلحات موضوعية: surface metrology, calibration, instrument transfer function, binary pseudo-random, test standard, power spectral density, aspheric optics, x-ray optics, Manufacturing Engineering, Engineering, Physical Sciences, Communications engineering, Electronics, sensors and digital hardware, Atomic, molecular and optical physics

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/17x0v1g1
https://escholarship.org/content/qt17x0v1g1/qt17x0v1g1.pdf

المؤلفون: Lin, Jie^{Aff3, Aff4}, Chua, Kian Jon^Aff5

المساهمون: Lin, Jie^Aff1, Chua, Kian Jon^Aff2

المصدر: Indirect Dew-Point Evaporative Cooling: Principles and Applications. :25-52

المؤلفون: Munechika, Keiko, Cabrini, Stefano, Chao, Weilun, Lacey, Ian, Pina-Hernandez, Carlos, Rochester, Simon, Yashchuk, Valeriy V

مصطلحات موضوعية: calibration, instrument transfer function, power spectral density, interferometric microscopes, binary pseudo-random, test standard, aberration, surface metrology

وصف الملف: application/pdf

URL الوصول: https://escholarship.org/uc/item/41824876

المؤلفون: Jog, Shreenivas, Bhatnagar, Vatsla, Burli, Roopa

المصدر: 2016 IEEE International Conference on Advances in Electronics, Communication and Computer Technology (ICAECCT) Advances in Electronics, Communication and Computer Technology (ICAECCT), 2016 IEEE International Conference on. :240-243 Dec, 2016

Relation: 2016 IEEE International Conference on Advances in Electronics, Communication and Computer Technology (ICAECCT)