المؤلفون: Tao, X., Yan, S., Gong, X., Adak, C.

المصدر: IEEE Transactions on Artificial Intelligence IEEE Trans. Artif. Intell. Artificial Intelligence, IEEE Transactions on. 5(1):127-139 Jan, 2024

المؤلفون: Devillard, Alexis, Ramasamy, Aruna, Faux, Damien, Hayward, Vincent, Burdet, Etienne

المصدر: 2023 IEEE World Haptics Conference (WHC) World Haptics Conference (WHC), 2023 IEEE. :101-106 Jul, 2023

Relation: 2023 IEEE World Haptics Conference (WHC)

المؤلفون: Kumar, S., Vahlman, H., Al-Hajjawi, S., Diestel, C., Haunschild, J., Rupitsch, S.J., Rein, S.

المصدر: IEEE Journal of Photovoltaics IEEE J. Photovoltaics Photovoltaics, IEEE Journal of. 13(5):711-715 Sep, 2023

المؤلفون: Osman, A., Moreno, G., Myers, S., Narumanchi, S.V.J., Joshi, Y.

المصدر: IEEE Transactions on Components, Packaging and Manufacturing Technology IEEE Trans. Compon., Packag. Manufact. Technol. Components, Packaging and Manufacturing Technology, IEEE Transactions on. 13(5):615-627 May, 2023

المؤلفون: Sureshvarr, K., Kannan, R.^{Aff2, IDs40735024008335_cor2}, Udhayakumar, M., Baskar, B., George, Luckachan K., Alphonsa, Joseph, Sivashanmugam, P.^{Aff1, IDs40735024008335_cor7}

المصدر: Journal of Bio- and Tribo-Corrosion. 10(2)

المؤلفون: Tao, X., Adak, C., Chun, P., Yan, S., Liu, H.

المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-13 2023

المؤلفون: Tyrone D. Dass, Sreedhara Rao Gunakala, Donna Comissiong, Hazi Md Azamathulla, Hector Martin, Sivaraj Ramachandran

المصدر: Results in Engineering, Vol 22, Iss , Pp 102338- (2024)

مصطلحات موضوعية: Textured surfaces, Load-carrying capacity, Pressure distribution, Variable viscosity, Couple-stress parameter, Magnetic effects, Technology

وصف الملف: electronic resource

Relation: http://www.sciencedirect.com/science/article/pii/S2590123024005930; https://doaj.org/toc/2590-1230

URL الوصول: https://doaj.org/article/38d3a00851a0457493d0eea883134c8b

المؤلفون: Yuan, Yanjie^{Aff1, Aff2}, Yu, Kunkun, Zhang, Chen^{Aff1, IDs41871023001982_cor3}, Chen, Qi, Yang, Weixiang

المصدر: Nanomanufacturing and Metrology. 6(1)

المؤلفون: Razak, Nurul Huda Abdul, Sopian, Kamaruzzaman, Amin, Nowshad, Akhtaruzzaman, Md.

المصدر: 2020 IEEE International Conference on Semiconductor Electronics (ICSE) Semiconductor Electronics (ICSE), 2020 IEEE International Conference on. :116-119 Jul, 2020

Relation: 2020 IEEE International Conference on Semiconductor Electronics (ICSE)

المؤلفون: Duchowski, A.T., Krejtz, K., Zurawska, J., House, D.H.

المصدر: IEEE Transactions on Visualization and Computer Graphics IEEE Trans. Visual. Comput. Graphics Visualization and Computer Graphics, IEEE Transactions on. 26(9):2904-2918 Sep, 2020