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1دورية أكاديمية
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(8):4617-4623 Aug, 2022
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2مؤتمر
المؤلفون: Thavamalar, B., Dhamodaran, M.
المصدر: 2016 International Conference on Advanced Communication Control and Computing Technologies (ICACCCT) Advanced Communication Control and Computing Technologies (ICACCCT), 2016 International Conference on. :290-293 May, 2016
Relation: 2016 International Conference on Advanced Communication Control and Computing Technologies (ICACCCT)
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3مؤتمر
المؤلفون: Niu, Gang, Chien, Wei-Ting Kary, Zhang, Guan, Yu, Jianshu, Zhao, Xiaodong, Duan, Xiaobo
المصدر: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits Physical and Failure Analysis of Integrated Circuits (IPFA), 2015 IEEE 22nd International Symposium on the. :342-345 Jun, 2015
Relation: 2015 IEEE 22nd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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4دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
5دورية أكاديمية
المؤلفون: Kin P Cheung
المصدر: Power Electronic Devices and Components, Vol 4, Iss , Pp 100024- (2023)
مصطلحات موضوعية: Thick oxide, Extrinsic breakdown, Atomic hydrogen, Trap-assisted-tunneling, Electric apparatus and materials. Electric circuits. Electric networks, TK452-454.4
وصف الملف: electronic resource
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6دورية أكاديمية
المؤلفون: Boukhayma, A., Peizerat, A., Enz, C.
المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 51(9):2180-2191 Sep, 2016
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7مؤتمر
المؤلفون: Jiao, Guangfan, Baek, Sungkweon, Nam, Kab-jin, Chang, Sung-Il, Cho, Siyeon, Kauerauf, Thomas, Lee, Chanho, Han, Seung-Uk, Kim, Jin-Soak, Chung, Eun-Ae, Shin, Yoo-Cheol, Lim, Junhee, Shin, Yu-Gyun, Hwang, Kihyun
المصدر: 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :DG-6.1-DG-6.3 Apr, 2017
Relation: 2017 IEEE International Reliability Physics Symposium (IRPS)
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8دورية أكاديمية
المؤلفون: Zhang, Q., Chen, J., Sherony, M. J.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 58(12):4393-4397 Dec, 2011
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9دورية أكاديمية
المؤلفون: Joshi, R. V., Mukhopadhyay, S., Plass, D. W., Chan, Y. H., Chuang, C.-T., Tan, Y.
المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 44(3):965-976 Mar, 2009
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10مؤتمر
المؤلفون: Varadharajaperumal, Muthubalan, Sirohi, Saurabh, Khandelwal, Sourabh, Tamilmani, Ethirajan, Subramanian, Vaidyananthan
المصدر: 2010 23rd International Conference on VLSI Design VLSI Design, 2010. VLSID '10. 23rd International Conference on. :212-217 Jan, 2010
Relation: 2010 23rd International Conference on VLSI Design: concurrently with the 9th International Conference on Embedded Systems Design (VLSID)