يعرض 1 - 10 نتائج من 1,180 نتيجة بحث عن '"thin oxide"', وقت الاستعلام: 0.85s تنقيح النتائج
  1. 1
    مؤتمر
    A 0.5 μm2 2-T Thin-Oxide OTP Antifuse with Reliability Enhanced by Auto Shut-off Program Logic for Low-Power Applications

    المؤلفون: Li, Haoyu, Wang, Dong, Zhou, Jiazheng, Liu, Junhua, Liao, Huailin

    المصدر: 2024 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2024 IEEE International Symposium on. :1-5 May, 2024

    Relation: 2024 IEEE International Symposium on Circuits and Systems (ISCAS)

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  2. 2
    مؤتمر
    Thin Gate Oxide CMOS DC-DC Buck Converter with Floating Gate Drivers

    المؤلفون: Gak, Joel, Marin, Jorge, Gonzalez, Nicolas, Arevalos, Daniel, Calarco, Nicolas, Miguez, Matias, Cortes, Alfonso, Osorio, Vicente, Romero, Mario, Rojas, Christian A.

    المصدر: 2024 Argentine Conference on Electronics (CAE) Electronics (CAE), 2024 Argentine Conference on. :120-123 Mar, 2024

    Relation: 2024 Argentine Conference on Electronics (CAE)

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  3. 3
    مؤتمر
    Multilevel resistive switching in thin oxide films for neuromorphic systems of artificial intillegence: simulation & experimental investigation

    المؤلفون: Tominov, Roman, Vakulov, Zakhar, Kazantsev, Victor, Prakash, Chander, Ugryumov, Ivan, Smirnov, Vladimir

    المصدر: 2023 7th Scientific School Dynamics of Complex Networks and their Applications (DCNA) Scientific School Dynamics of Complex Networks and their Applications (DCNA), 2023 7th. :273-276 Sep, 2023

    Relation: 2023 7th Scientific School Dynamics of Complex Networks and their Applications (DCNA)

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  4. 4
    مؤتمر
    Validation Technique for Thin Oxide CDM Protections

    المؤلفون: Dobre, Mihaela-Daniela, Coll, Philippe, Brezeanu, Gheorghe

    المصدر: 2022 International Semiconductor Conference (CAS) Semiconductor Conference (CAS), 2022 International. :131-134 Oct, 2022

    Relation: 2022 International Semiconductor Conference (CAS)

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  5. 5
    مؤتمر
    Thin Oxide Films for Transparent Electronics and Full Color Displays

    المؤلفون: Bordun, O.M., Bordun, B.O., Kofliuk, I.M., Kukharskyy, I.Yo., Medvid, I.I., Protsak, M.V.

    المصدر: 2021 IEEE 12th International Conference on Electronics and Information Technologies (ELIT) Electronics and Information Technologies (ELIT), 2021 IEEE 12th International Conference on. :33-36 May, 2021

    Relation: 2021 IEEE 12th International Conference on Electronics and Information Technologies (ELIT)

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  6. 6
    مؤتمر
    Secure IC with Countermeasure to Unpowered Physical Attack using On-chip Photodiode and Charge Pump

    المؤلفون: Heo, Hyunwoo, You, Donggeun, Kim, Hyungseup, Kwon, Yongsu, Ko, Hyoungho, Kim, Dong Kyue, Choi, Byong-Deok, Kim, Ji-Hoon

    المصدر: 2021 International Conference on Electronics, Information, and Communication (ICEIC) Electronics, Information, and Communication (ICEIC), 2021 International Conference on. :1-4 Jan, 2021

    Relation: 2021 International Conference on Electronics, Information, and Communication (ICEIC)

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  7. 7
    دورية أكاديمية
    BEOL Compatible Indium-Tin-Oxide Transistors: Switching of Ultrahigh-Density 2-D Electron Gas Over 0.8 × 1014/cm2 at Oxide/Oxide Interface by the Change of Ferroelectric Polarization

    المؤلفون: Si, M., Murray, A., Lin, Z., Andler, J., Li, J., Noh, J., Alajlouni, S., Niu, C., Lyu, X., Zheng, D., Maize, K., Shakouri, A., Datta, S., Agrawal, R., Ye, P.D.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(7):3195-3199 Jul, 2021

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  8. 8
    مؤتمر
    Program Disturb Mechanism in Embedded SuperFlash® Technology

    المؤلفون: Dunn, Clyde, MacPeak, John, Bo, Sean, Kirkpatrick, Brian, Horning, Brian, Grider, Tad, O'Brien, Corey, Heinrich-Barna, Steve, Vigil, Armando, Nafziger, Jon, Preiss, Lyndon, DeShields, Kelly, Markov, Viktor, Kim, JinHo, Do, Nhan, Kotov, Alexander

    المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020

    Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)

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  9. 9
    دورية أكاديمية
    Role of Schottky Barrier Height Modulation on the Reverse Bias Current Behavior of MIS(p) Tunnel Diodes

    المؤلفون: Chen, K., Lin, K., Hwu, J.

    المصدر: IEEE Access Access, IEEE. 9:163929-163937 2021

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  10. 10
    دورية أكاديمية
    Analysis of the Oxidation Behavior and Formation of an Extremely Thin Oxide Layer with a Novel Hot-Stamped Steel

    المؤلفون: Yan Zhao, Lei Liu, Dengcui Yang, Weinan Li, Jianlin Yu, Zhengzhi Zhao

    المصدر: Metals, Vol 14, Iss 7, p 760 (2024)

    مصطلحات موضوعية: 38Cr3MnNbVMo hot-stamped steel, high-temperature oxidation resistance, extremely thin oxide layer, Fe2SiO4 and FeCr2O4 oxides, Mining engineering. Metallurgy, TN1-997

    وصف الملف: electronic resource

    Relation: https://www.mdpi.com/2075-4701/14/7/760; https://doaj.org/toc/2075-4701

    URL الوصول: https://doaj.org/article/955f22301f1d4db48daf58703db31993

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