المؤلفون: Sindhwani, R., Vaidya, O.S., Antony, J., Shokri, A.

المصدر: IEEE Transactions on Engineering Management IEEE Trans. Eng. Manage. Engineering Management, IEEE Transactions on. 70(10):3539-3552 Oct, 2023

المؤلفون: Tanaka, Motoharu, Nagata, Takuya, Nishi, Yusuke, Arima, Sumika

المصدر: 2018 7th International Congress on Advanced Applied Informatics (IIAI-AAI) IIAI-AAI Advanced Applied Informatics (IIAI-AAI), 2018 7th International Congress on. :639-644 Jul, 2018

Relation: 2018 7th International Congress on Advanced Applied Informatics (IIAI-AAI)

المؤلفون: Denlinger, Daniel

المصدر: 2018 Annual Reliability and Maintainability Symposium (RAMS) Reliability and Maintainability Symposium (RAMS), 2018. :1-7 Jan, 2018

Relation: 2018 Annual Reliability and Maintainability Symposium (RAMS)

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المؤلفون: Turpin, Jr., Lonnie^Aff1, Brown, Barron

المصدر: Operations Research Forum. 2(2)

المؤلفون: Hannila, E. (Esa)

المساهمون: Fabritius, T. (Tapio)

مصطلحات موضوعية: pintaa rikkomaton rakenneanalyysi, reliability, taivutus (työstö), bending, hybrid structural electronics, production throughput yield, prosessin saanto, tulostettava elektroniikka, simulointi, non-destructive structural analysis, printed electronics, simulations, rakenteellinen hybridielektroniikka, luotettavuus

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=od______2423::1faaca2d3d1044fb7f26b2cb0bae9c8a
http://urn.fi/urn:isbn:9789526237176

المؤلفون: Jin, Jie^Aff6, Ma, Yi-zhong^Aff6, Ouyang, Lin-han^Aff6, Gu, Xiao-guang^Aff6

المساهمون: Qi, Ershi, editor^Aff1, Su, Qin, editor^Aff2, Shen, Jiang, editor^Aff3, Wu, Feng, editor^Aff4, Dou, Runliang, editor^Aff5

المصدر: Proceedings of the 5th International Asia Conference on Industrial Engineering and Management Innovation (IEMI2014). 1:239-243

المؤلفون: Rohit Sindhwani, Alireza Shokri, Omkarprasad S. Vaidya, Jiju Antony

المصدر: IEEE Transactions on Engineering Management. :1-14

مصطلحات موضوعية: Rolled throughput yield, Total quality management, Work breakdown structure, K900, Computer science, Strategy and Management, media_common.quotation_subject, Six Sigma, Analytic hierarchy process, Sigma, H900, Industrial engineering, Quality (business), N100, Metric (unit), N200, Electrical and Electronic Engineering, media_common

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a6cbd953c852d39fb09c00d525f33927
https://doi.org/10.1109/tem.2021.3092885

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المؤلفون: Chaudhuri, Debaprayag, Ranjan Mukhopadhyay, Arup, Ghosh, Sadhan Kumar

المصدر: International Journal of Quality & Reliability Management, 2011, Vol. 28, Issue 9, pp. 969-1001.

URL الوصول: http://www.emeraldinsight.com/doi/10.1108/02656711111172540