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1دورية أكاديمية
المؤلفون: Yi, W., Tiantian, H., Lingyun, Y., Zhijuan, Z., Kaichen, S.
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(14):22486-22501 Jul, 2024
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2مؤتمر
المؤلفون: Rajabi, Amir, Krini, Mohammed
المصدر: 2024 9th International Conference on Computer and Communication Systems (ICCCS) Computer and Communication Systems (ICCCS), 2024 9th International Conference on. :525-530 Apr, 2024
Relation: 2024 9th International Conference on Computer and Communication Systems (ICCCS)
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3دورية أكاديمية
المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 39(10):13783-13794 Oct, 2024
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4مؤتمر
المؤلفون: Barik, Swagata, Pal, Saurabh
المصدر: 2023 IEEE 3rd Applied Signal Processing Conference (ASPCON) Applied Signal Processing Conference (ASPCON), 2023 IEEE 3rd. :216-221 Nov, 2023
Relation: 2023 IEEE 3rd Applied Signal Processing Conference (ASPCON)
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5دورية أكاديمية
المؤلفون: Laleye, Fréjus A. A.Aff1, IDs11042024182419_cor1, Mousse, Mikaël A.
المصدر: Multimedia Tools and Applications: An International Journal. 83(22):62443-62458
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6مؤتمر
المؤلفون: Ke, Haobin, Chen, Zhiwen, Xu, Jiamin, Fan, Xinyu, Yang, Chao, Peng, Tao
المصدر: 2023 IEEE 12th Data Driven Control and Learning Systems Conference (DDCLS) Data Driven Control and Learning Systems Conference (DDCLS), 2023 IEEE 12th. :1786-1792 May, 2023
Relation: 2023 IEEE 12th Data Driven Control and Learning Systems Conference (DDCLS)
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7دورية أكاديمية
المؤلفون: Jia, Xiaoqi, Zhang, Shuaikang, Zhu, ZuchaoAff1, IDs40997023006915_cor3
المصدر: Iranian Journal of Science and Technology, Transactions of Mechanical Engineering. 48(2):615-627
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8دورية أكاديمية
المؤلفون: Sharma, Anshul, Arora, Vanita, Mulaveesala, RavibabuAff1, IDS1061830924601429_cor3
المصدر: Russian Journal of Nondestructive Testing. 60(5):562-573
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9دورية أكاديمية
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-13 2023
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10دورية أكاديمية
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-11 2023