يعرض 1 - 10 نتائج من 762 نتيجة بحث عن '"trapped charge"', وقت الاستعلام: 1.08s تنقيح النتائج
  1. 1
    دورية أكاديمية
    Strategies for a Wide Memory Window of Ferroelectric FET for Multilevel Ferroelectric VNAND Operation

    المؤلفون: Myeong, I., Kim, H., Kim, S., Lim, S., Kim, K., Kim, W., Ha, D., Ahn, S., Song, J.

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(7):1185-1188 Jul, 2024

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  2. 2
    دورية أكاديمية
    From Accelerated to Operating Conditions: How Trapped Charge Impacts on TDDB in SiO₂ and HfO₂ Stacks

    المؤلفون: Vecchi, S., Padovani, A., Pavan, P., Puglisi, F.M.

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 24(2):194-202 Jun, 2024

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  3. 3
    مؤتمر
    Optical Probing of Charge Retention Time in Semiconductor/Dielectric Structure

    المؤلفون: Mallick, Binit, Saha, Dipankar, Datta, Anindya, Ganguly, Swaroop

    المصدر: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) Electron Devices Technology & Manufacturing Conference (EDTM), 2024 8th IEEE. :1-3 Mar, 2024

    Relation: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)

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  4. 4
    مؤتمر
    The Major Effect of Trapped Charge on Dielectric Breakdown Dynamics and Lifetime Estimation

    المؤلفون: Vecchi, Sara, Padovani, Andrea, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: 2023 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2023 IEEE International. :1-7 Oct, 2023

    Relation: 2023 IEEE International Integrated Reliability Workshop (IIRW)

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  5. 5
    دورية أكاديمية
    Electrical Response of Al Based Zr-Doped Stacked Tri-Layer HfO2 Deposited at Various Substrate Temperature

    المؤلفون: Sultana, R.Aff1, IDs1118202403198x_cor1, Islam, K., Chakraborty, S.

    المصدر: Russian Physics Journal. 67(7):923-931

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  6. 6
    مؤتمر
    A Method for Power Cable Space Charge Detection Based on Electric Field Stimulation

    المؤلفون: Pan, Shaoming, Zhang, Yiyi, Tang, Jie, Feng, Bo, Zhang, Lei, Zhao, Jian, Zhang, Longfei

    المصدر: 2023 Panda Forum on Power and Energy (PandaFPE) Power and Energy (PandaFPE), 2023 Panda Forum on. :585-589 Apr, 2023

    Relation: 2023 Panda Forum on Power and Energy (PandaFPE)

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  7. 7
    مؤتمر
    A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs

    المؤلفون: Vecchi, Sara, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: 2023 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2023 IEEE International. :1-6 Mar, 2023

    Relation: 2023 IEEE International Reliability Physics Symposium (IRPS)

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  8. 8
    دورية أكاديمية
    The Impact of Electrostatic Interactions Between Defects on the Characteristics of Random Telegraph Noise

    المؤلفون: Vecchi, S., Pavan, P., Puglisi, F.M.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):6991-6998 Dec, 2022

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  9. 9
    مؤتمر
    The Relevance of Trapped Charge for Leakage and Random Telegraph Noise Phenomena

    المؤلفون: Vecchi, Sara, Pavan, Paolo, Puglisi, Francesco Maria

    المصدر: 2022 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2022 IEEE International. :1-6 Mar, 2022

    Relation: 2022 IEEE International Reliability Physics Symposium (IRPS)

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  10. 10
    دورية أكاديمية
    Electron Spin Resonance Dating of Shells—A Systematic Literature Review

    المؤلفون: Kinoshita, AngelaAff1, IDs1353802401569w_cor1, Lopes, Renato Pereira, Baffa, Oswaldo

    المصدر: Brazilian Journal of Physics. 54(5)

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