يعرض 1 - 10 نتائج من 230 نتيجة بحث عن '"uv response"', وقت الاستعلام: 1.03s تنقيح النتائج
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    دورية أكاديمية

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(12):12759-12766 Jun, 2023

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    كتاب إلكتروني

    المؤلفون: Pettinato, SaraAff38, Rossi, Maria CristinaAff39, Salvatori, StefanoAff38

    المساهمون: Angrisani, Leopoldo, Series EditorAff1, Arteaga, Marco, Series EditorAff2, Chakraborty, Samarjit, Series EditorAff3, Chen, Jiming, Series EditorAff4, Chen, Shanben, Series EditorAff5, Chen, Tan Kay, Series EditorAff6, Dillmann, Rüdiger, Series EditorAff7, Duan, Haibin, Series EditorAff8, Ferrari, Gianluigi, Series EditorAff9, Ferre, Manuel, Series EditorAff10, Jabbari, Faryar, Series EditorAff11, Jia, Limin, Series EditorAff12, Kacprzyk, Janusz, Series EditorAff13, Khamis, Alaa, Series EditorAff14, Kroeger, Torsten, Series EditorAff15, Li, Yong, Series EditorAff16, Liang, Qilian, Series EditorAff17, Martín, Ferran, Series EditorAff18, Ming, Tan Cher, Series EditorAff19, Minker, Wolfgang, Series EditorAff20, Misra, Pradeep, Series EditorAff21, Mukhopadhyay, Subhas, Series EditorAff22, Ning, Cun-Zheng, Series EditorAff23, Nishida, Toyoaki, Series EditorAff24, Oneto, Luca, Series EditorAff25, Panigrahi, Bijaya Ketan, Series EditorAff26, Pascucci, Federica, Series EditorAff27, Qin, Yong, Series EditorAff28, Seng, Gan Woon, Series EditorAff29, Speidel, Joachim, Series EditorAff30, Veiga, Germano, Series EditorAff31, Wu, Haitao, Series EditorAff32, Zamboni, Walter, Series EditorAff33, Zhang, Junjie James, Series EditorAff34, Tan, Kay Chen, Series EditorAff35, Ciofi, Carmine, editorAff36, Limiti, Ernesto, editorAff37

    المصدر: Proceedings of SIE 2023 : 54th Annual Meeting of the Italian Electronics Society. 1113:214-219

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    دورية أكاديمية
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    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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    دورية أكاديمية

    المؤلفون: Raja, P.V., Murty, N.V.L.N.

    المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 65(1):558-565 Jan, 2018