المؤلفون: Recalde-Benitez, Oscar, Jiang, Tianshu, Winkler, Robert, Ruan, Yating, Zintler, Alexander, Adabifiroozjaei, Esmaeil, Arzumanov, Alexey, Hubbard, William A., van Omme, Tijn, Pivak, Yevheniy, Perez-Garza, Hector H., Regan, B. C.^{Aff3, Aff5}, Alff, Lambert, Komissinskiy, Philipp, Molina-Luna, Leopoldo^{Aff1, IDs44172023001339_cor15}

المصدر: Communications Engineering. 2(1)

المؤلفون: Van Swieten, Thomas P., Van Omme, Tijn, Van Den Heuvel, Dave J., Vonk, Sander J.W., Spruit, Ronald G., Meirer, Florian, Garza, H. Hugo Pérez, Weckhuysen, Bert M., Meijerink, Andries, Rabouw, Freddy T., Geitenbeek, Robin G., Sub Condensed Matter and Interfaces, Sub Molecular Biophysics, Sub Inorganic Chemistry and Catalysis, Sub Soft Condensed Matter, Faculteit Betawetenschappen, Sub Algemeen Scheikunde, Soft Condensed Matter and Biophysics

المساهمون: Sub Condensed Matter and Interfaces, Sub Molecular Biophysics, Sub Inorganic Chemistry and Catalysis, Sub Soft Condensed Matter, Faculteit Betawetenschappen, Sub Algemeen Scheikunde, Soft Condensed Matter and Biophysics

المصدر: ACS Applied Nano Materials, 4(4), 4208. American Chemical Society
ACS Applied Nano Materials

مصطلحات موضوعية: Materials science, business.industry, Scattering, spectral artifacts, Resolution (electron density), photonics, Nanoparticle, Article, Micrometre, nanothermometry, temperature mapping, Materials Science(all), Nanoelectronics, Microscopy, luminescence, microscopy, Optoelectronics, General Materials Science, business, Luminescence, Image resolution

وصف الملف: application/pdf

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::784346da5f4dc3c420a0bb4b57189838
https://doi.org/10.1021/acsanm.1c00657

المؤلفون: Recalde, Oscar, Jiang, Tianshu, Eilhardt, Robert, Zintler, Alexander, Ruan, Yating, Arzumanov, Alexey, van Omme, Tijn, Pivak, Gin, Perez-Garza, Hector H., Komissinskiy, Philipp, Alff, Lambert, Molina-Luna, Leopoldo

المصدر: Microscopy & Microanalysis; 2022 Supplement, Vol. 28, p820-821, 2p

المؤلفون: Pivak, Yevheniy, Sun, Hongyu, van Omme, Tijn, Bladt, Eva, Pérez-Garza, H Hugo, Conroy, Michelle, Molina-Luna, Leopoldo

المصدر: Microscopy & Microanalysis; 2023 Supplement, p1695-1695, 1p