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1مؤتمر
المؤلفون: Williams, K., Le, M., Kaminski, T., Van Wyk, E.
المصدر: 2014 43rd International Conference on Parallel Processing Parallel Processing (ICPP), 2014 43rd International Conference on. :471-480 Sep, 2014
Relation: 2014 43nd International Conference on Parallel Processing (ICPP)
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2مؤتمر
المؤلفون: Weichsel, C., Pagni, O., Somhlahlo, N., van Wyk, E., Leitch, A.W.R.
المصدر: 12th International Symposium on Electron Devices for Microwave and Optoelectronic Applications, 2004. EDMO 2004. Electron devices for microwave and optoelectronic applications Electron Devices for Microwave and Optoelectronic Applications, 2004. EDMO 2004. 12th International Symposium on. :23-26 2004
Relation: The 12th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications
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3مؤتمر
المؤلفون: van Wyk, E.
المصدر: The IEEE Region 8 EUROCON 2003. Computer as a Tool. EUROCON 2003 computer as a tool EUROCON 2003. Computer as a Tool. The IEEE Region 8. 2:427-431 vol.2 2003
Relation: IEEE Region 8 EUROCON 2003. Computer as a Tool. Proceedings
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4مؤتمر
المؤلفون: Van Wyk, E., Johnson, E.
المصدر: 2007 40th Annual Hawaii International Conference on System Sciences (HICSS'07) System Sciences, 2007. HICSS 2007. 40th Annual Hawaii International Conference on. :258c-258c Jan, 2007
Relation: 2007 40th Annual Hawaii International Conference on System Sciences
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5مؤتمر
المؤلفون: Van Wyk, E., Krishnan, L., Bodin, D., Johnson, E., Schwerdfeger, A., Russell, P.
المصدر: 2006 Sixth IEEE International Workshop on Source Code Analysis and Manipulation Source Code Analysis and Manipulation, 2006. SCAM '06. Sixth IEEE International Workshop on. :161-161 Sep, 2006
Relation: 2006 Sixth IEEE International Workshop on Source Code Analysis and Manipulation
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6كتاب إلكتروني
المؤلفون: van Wyk, E.Aff1, Yadavalli, V. S. S.Aff1, Carstens, H.Aff1
المساهمون: Patnaik, Srikanta, editorAffID1, Tripathy, Piyu, editorAffID2, Naik, Sagar, editorAffID3
المصدر: New Paradigms in Internet Computing. 203:13-22
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7دورية أكاديمية
المؤلفون: Becker, L. R., Beukes, L. D., Botha, A., Botha, A. C., Botha, J. J., Botha, M., Cloete, D. J., Cloete, J. L., Coetzee, C., De Beer, L. J., De Bruin, D. J., De Jager, L., De Villiers, J. J. R., Du Toit, C. M., Engelbrecht, A., Evans, R., Haupt, M. M. C., Heyns, D., Howatt, L. M., Joubert, A. P., Joubert, J. C., Niemann, A. C., Phatudi, N. C., Randall, E., Rauscher, W. J., Rautenbach, W. C., Scholtz, S., Schultz, J. C., Swart, R., Van Aswegen, H. J., Van Heerden, J. C., Van Vollenhoven, W. J., Van Wyk, E. M., Van Wyk, J. G. U., Van der Walt, C. A., Van der Westhuizen, C. N., Vermeulen, D., Vorster, A.
المصدر: Higher Education: The International Journal of Higher Education and Educational Planning. Sep 2004 48(2):153-172.
Peer Reviewed: Y
Page Count: 20
Descriptors: Foreign Countries, Organizational Change, Universities, College Faculty, Employee Attitudes, Work Attitudes, Psychological Patterns
مصطلحات جغرافية: South Africa
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8دورية أكاديمية
المؤلفون: van Wyk, E.
المصدر: Meditari Accountancy Research, 2010, Vol. 18, Issue 1, pp. 58-75.
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9دورية أكاديمية
المؤلفون: Mirumachi, N., van Wyk, E.
المصدر: The Geographical Journal, 2010 Mar 01. 176(1), 25-38.
URL الوصول: https://www.jstor.org/stable/25621860
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10مؤتمر
المؤلفون: Van Wyk, E. B.
Peer Reviewed: N
Page Count: 8