المؤلفون: Wang, D., Mudiyanselage, D.H., He, Z., Da, B., Fu, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1681-1686 Mar, 2024

المؤلفون: Lal, S., Lu, J., Thibeault, B.J., Wong, M.H., van de Walle, C.G., DenBaars, S.P., Mishra, U.K.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(3):1702-1709 Mar, 2024

المؤلفون: Benjelloun, M., Zaidan, Z., Soltani, A., Gogneau, N., Morris, D., Harmand, J., Maher, H.M.

المصدر: IEEE Access Access, IEEE. 11:40249-40257 2023

المؤلفون: Doring, P., Driad, R., Reiner, R., Waltereit, P., Leone, S., Mikulla, M., Ambacher, O.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(11):5547-5552 Nov, 2021

المؤلفون: Stoklas, R., Chvala, A., Sichman, P., Hasenohrl, S., Hascik, S., Priesol, J., Satka, A., Kuzmik, J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(5):2365-2371 May, 2021

المؤلفون: Fabris, E., De Santi, C., Caria, A., Li, W., Nomoto, K., Hu, Z., Jena, D., Xing, H.G., Meneghesso, G., Zanoni, E., Meneghini, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(10):3954-3959 Oct, 2020

المؤلفون: Rosa, F. La, Niel, S., Regnier, A., Maugain, F., Mantelli, M., Conte, A.

المصدر: 2019 IEEE 11th International Memory Workshop (IMW) Memory Workshop (IMW), 2019 IEEE 11th International. :1-4 May, 2019

Relation: 2019 IEEE 11th International Memory Workshop (IMW)

المؤلفون: Hu, Zongyang, Nomoto, Kazuki, Li, Wenshen, Jinno, Riena, Nakamura, Tohru, Jena, Debdeep, Xing, Huili

المصدر: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) Power Semiconductor Devices and ICs (ISPSD), 2019 31st International Symposium on. :483-486 May, 2019

Relation: 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD)

المؤلفون: Ruzzarin, Maria, Borga, Matteo, Zanoni, Enrico, Meneghini, Matteo, Meneghesso, Gaudenzio, Ji, Dong, Li, Wenwen, Chan, Silvia H., Agarwal, Anchal, Gupta, Chirag, Keller, Stacia, Mishra, Umesh K., Chowdhury, Srabanti

المصدر: 2019 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2019 IEEE International. :1-5 Mar, 2019

Relation: 2019 IEEE International Reliability Physics Symposium (IRPS)

المؤلفون: Spessot, A., Oh, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(4):1382-1393 Apr, 2020