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1مؤتمر
المؤلفون: Pasquinelli, Valentina, Martarelli, Milena, Paone, Nicola, van de Kamp, Wilhelm, Verhoef, Bart
المصدر: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT), 2024 IEEE International Workshop on. :470-475 May, 2024
Relation: 2024 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0 & IoT)
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2مؤتمر
المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-5 Apr, 2024
Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)
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3رسالة جامعية
المؤلفون: Moliner-Heredia, Rubén
المساهمون: University/Department: Universitat Jaume I. Escola de Doctorat
مرشدي الرسالة: Peñarrocha-Alós, Ignacio, Abellán-Nebot, José V.
المصدر: TDX (Tesis Doctorals en Xarxa)
مصطلحات موضوعية: Zero Defect Manufacturing (ZDM), Stream of Variation (SoV), Fault Diagnosis (FD), Prognosis Adaptive Algorithms, Remaining Useful Life (RUL) of cutting tools, Ciències
وصف الملف: application/pdf
URL الوصول: http://hdl.handle.net/10803/687786
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4مؤتمر
المؤلفون: Maier, Florian A., Puppala, Sivaphani, Oberle, Michael
المصدر: 2024 International Conference on Artificial Intelligence in Information and Communication (ICAIIC) Artificial Intelligence in Information and Communication (ICAIIC), 2024 International Conference on. :778-784 Feb, 2024
Relation: 2024 International Conference on Artificial Intelligence in Information and Communication (ICAIIC)
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5دورية أكاديمية
المؤلفون: Psarommatis, F., Danishvar, M., Mousavi, A., Kiritsis, D.
المصدر: IEEE Transactions on Engineering Management IEEE Trans. Eng. Manage. Engineering Management, IEEE Transactions on. 71:702-714 2024
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6مؤتمر
المؤلفون: Medici, Vittoria, Martarelli, Milena, Paone, Nicola, Pandarese, Giuseppe, van de Kamp, Wilhelm, Verhoef, Bart, Sipsas, Konstantinos, Broechler, Raimund, Besada, Lara Barja, Alexopoulos, Kosmas, Nikolakis, Nikolaos
المصدر: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), 2023 IEEE International Workshop on. :439-444 Jun, 2023
Relation: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
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7مؤتمر
المؤلفون: Pasquinelli, Valentina, Martarelli, Milena, Paone, Nicola, Castellini, Paolo, Montalto, Luigi, Alexopoulos, Kosmas, Nikolakis, Nikolaos, Kamp, Wilhelm van de, Verhoef, Bart
المصدر: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), 2023 IEEE International Workshop on. :130-135 Jun, 2023
Relation: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
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8مؤتمر
المؤلفون: Discepolo, Silvia, Martarelli, Milena, Paone, Nicola, Castellini, Paolo, Kamp, Wilhelm van de, Verhoef, Bart, Nikolakis, Nikolaos, Alexopoulos, Kosmas
المصدر: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT) Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), 2023 IEEE International Workshop on. :136-141 Jun, 2023
Relation: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT)
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9
المؤلفون: Psarommatis, F., May, G., Azamfirei, Victor, Konstantinidis, F.
المصدر: Procedia Computer Science. :2857-2866
مصطلحات موضوعية: in-process inspection, Industry 4.0, Quality inspection, vision systems, ZDM, Zero Defect Manufacturing
وصف الملف: print
URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-66461
https://doi.org/10.1016/j.procs.2024.02.102 -
10Towards Zero-Defect Manufacturing: a review on measurement-assisted processes and their technologies
المؤلفون: Azamfirei, Victor, Psarommatis, F., Granlund, Anna, 1984, Lagrosen, Yvonne, 1966
المصدر: Procedia Computer Science. :1001-1010
مصطلحات موضوعية: in-line, measurement-assisted, Quality Control, Zero Defect Manufacturing (ZDM)
وصف الملف: print
URL الوصول: https://urn.kb.se/resolve?urn=urn:nbn:se:mdh:diva-66467
https://doi.org/10.1016/j.procs.2024.01.099
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