دورية أكاديمية
Disentangling doping and strain effects at defects of grown MoS 2 monolayers with nano-optical spectroscopy.
العنوان: | Disentangling doping and strain effects at defects of grown MoS |
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المؤلفون: | Sousa FB; Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, Minas Gerais 30123-970, Brazil. lmalard@fisica.ufmg.br., Nadas R; Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, Minas Gerais 30123-970, Brazil. lmalard@fisica.ufmg.br.; FabNS, Belo Horizonte, Minas Gerais 31310-260, Brazil., Martins R; Departamento de Física, Universidade Federal de Ouro Preto, Ouro Preto, Minas Gerais 35400-000, Brazil., Barboza APM; Departamento de Física, Universidade Federal de Ouro Preto, Ouro Preto, Minas Gerais 35400-000, Brazil., Soares JS; Departamento de Física, Universidade Federal de Ouro Preto, Ouro Preto, Minas Gerais 35400-000, Brazil., Neves BRA; Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, Minas Gerais 30123-970, Brazil. lmalard@fisica.ufmg.br., Silvestre I; Departamento de Física, Universidade Federal de Ouro Preto, Ouro Preto, Minas Gerais 35400-000, Brazil., Jorio A; Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, Minas Gerais 30123-970, Brazil. lmalard@fisica.ufmg.br., Malard LM; Departamento de Física, Universidade Federal de Minas Gerais, Belo Horizonte, Minas Gerais 30123-970, Brazil. lmalard@fisica.ufmg.br. |
المصدر: | Nanoscale [Nanoscale] 2024 Jul 11; Vol. 16 (27), pp. 12923-12933. Date of Electronic Publication: 2024 Jul 11. |
نوع المنشور: | Journal Article |
اللغة: | English |
بيانات الدورية: | Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Electronic Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: PubMed not MEDLINE; MEDLINE |
أسماء مطبوعة: | Original Publication: Cambridge, UK : RSC Pub. |
مستخلص: | The role of defects in two-dimensional semiconductors and how they affect the intrinsic properties of these materials have been a widely researched topic over the past few decades. Optical characterization techniques such as photoluminescence and Raman spectroscopies are important tools to probe the physical properties of semiconductors and the impact of defects. However, confocal optical techniques present a spatial resolution limitation lying in a μm-scale, which can be overcome by the use of near-field optical measurements. Here, we use tip-enhanced photoluminescence and Raman spectroscopies to unveil the nanoscale optical properties of grown MoS |
تواريخ الأحداث: | Date Created: 20240528 Latest Revision: 20240711 |
رمز التحديث: | 20240711 |
DOI: | 10.1039/d4nr00837e |
PMID: | 38805074 |
قاعدة البيانات: | MEDLINE |
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