التفاصيل البيبلوغرافية
| العنوان: |
Refractive Optics for Modifying X-Ray Wavefronts. |
| المؤلفون: |
Laundy, David, Moxham, Thomas, Dhamgaye, Vishal, Khosroabadi, Hossein, Fox, Oliver, Sawhney, Kawal |
| المصدر: |
Synchrotron Radiation News; Nov/Dec2021, Vol. 34 Issue 6, p27-31, 5p |
| مصطلحات موضوعية: |
X-ray optics, WAVEFRONT sensors, WAVEFRONTS (Optics), OPTICAL apertures, OPTICAL elements, FOCUS (Optics), FOCAL planes |
| مستخلص: |
The measured wavefront slope is projected from the detector through the focus to the Using refractors to modify the X-ray wavefront Modification of the X-ray wavefront can be done to compensate for imperfect optics, the so-called wavefront correction. The wavefront error can be defined as the displacement along the wavefront normal of the actual from the ideal wavefront. Modifying the wavefront to vary the X-ray focus size At SR facilities, there has been much interest in wavefront correction for applications such as micro-probe experiments that require the smallest possible focus; to achieve this, the wavefront error should be minimized. Wavefront measurement The wavefront can be directly measured by a number of methods, such as the grating method, Hartmann sensor, speckle tracking method, knife-edge method, and ptychographic reconstruction. [Extracted from the article] |
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| قاعدة البيانات: |
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