التفاصيل البيبلوغرافية
| العنوان: |
Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions. |
| المؤلفون: |
Hosier, Adam, Dipti, Yang, Yang, Szypryt, Paul, Mondeel, Grant P., Naing, Aung, Tan, Joseph N., Silwal, Roshani, O'Neil, Galen, Lapierre, Alain, Blundell, Steven A., Gillaspy, John D., Gwinner, Gerald, Villari, Antonio C. C., Ralchenko, Yuri, Takacs, Endre |
| المصدر: |
Atoms (2218-2004); Mar2023, Vol. 11 Issue 3, p48, 7p |
| مصطلحات موضوعية: |
SPECTRAL lines, X-ray spectroscopy, ULTRAVIOLET spectra, HEAVY elements, HEAVY ions |
| الشركة/الكيان: |
NATIONAL Institute of Standards & Technology (U.S.) |
| مستخلص: |
Extreme ultraviolet spectra of Na-like and Mg-like Os and Ir were recorded at the National Institute of Standards and Technology using a grazing incidence spectrometer. We report a method in EBIT spectral analysis that reduces signals from contaminant lines of known or unknown origin. We utilize similar ion charge distributions of heavy highly charged ions that create similar potentials for lighter contaminating background elements. First-order approximations to ion distributions are presented to demonstrate differences between impurity elements with and without heavy ions present. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
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