دورية أكاديمية
Correlative Surface Analysis: Combining XPS, Electron Microscopy, and Other Spectroscopies.
| العنوان: | Correlative Surface Analysis: Combining XPS, Electron Microscopy, and Other Spectroscopies. |
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| المؤلفون: | Lallo, James, Nunney, Tim S, Mack, Paul, Simpson, Robin, Oppong-Mensah, Helen |
| المصدر: | Microscopy & Microanalysis; 2023 Supplement, p789-789, 1p |
| قاعدة البيانات: | Complementary Index |
Full Text Finder | تدمد: | 14319276 |
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| DOI: | 10.1093/micmic/ozad067.392 |