التفاصيل البيبلوغرافية
| العنوان: |
Electronic structures of skyrmionic polycrystalline MnSi thin film studied by resonance photoemission and x-ray near edge spectroscopy. |
| المؤلفون: |
Jena, S., Urkude, R., Choi, W.-Y., Pandey, K. K., Karwal, S., Jung, M. H., Gardner, J., Ghosh, B., Singh, V. R. |
| المصدر: |
Journal of Applied Physics; 4/28/2024, Vol. 135 Issue 16, p1-10, 10p |
| مصطلحات موضوعية: |
EXTENDED X-ray absorption fine structure, THIN films, SPHEROMAKS, PHOTOEMISSION, ELECTRONIC structure, PHOTOELECTRON spectroscopy, SAPPHIRES, X-ray spectroscopy |
| مستخلص: |
Magnetic nanometric skyrmions are small complex vortex-like topological defects, mainly found in non-centrosymmetric crystals such as MnSi. They have potential applications for future spintronic devices. In this article, the structural, electronic, and magnetic states of the Mn atoms in a polycrystalline MnSi thin film facing a c-sapphire substrate were studied using x-ray diffraction, x-ray photo-emission spectroscopy, resonance photoemission spectroscopy (RPES), and extended x-ray absorption fine structure (EXAFS). The valence band spectra indicate the metallic nature of the film. The RPES study reveals the presence of major itinerant Mn 3d states near EF and also the mixed Mn 3d and Si 3s–3p states from 5.3 to 11.3 eV. The EXAFS spectrum does not show the existence of oxygen vacancies in the system, and the obtained magnetic moment in the non-stoichiometric MnSi thin film is a combination of the partially itinerant and partially localized Mn 3d states. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
Complementary Index |
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