التفاصيل البيبلوغرافية
| العنوان: |
Development of a KDP crystal growth system based on TRM and characterization of the grown crystals. |
| المؤلفون: |
Javidi, S., Faripour, H., Nia, M. Esmaeil, Sepehri, K. F., Akbari, N. Ali |
| المصدر: |
Semiconductor Physics, Quantum Electronics & Optoelectronics; 2008, Vol. 11 Issue 3, p248-251, 4p, 3 Color Photographs, 1 Diagram, 1 Chart, 2 Graphs |
| مصطلحات موضوعية: |
CRYSTAL growth, SPECTROPHOTOMETERS, SPECTRUM analysis, MICROHARDNESS, ETCHING reagents |
| مستخلص: |
A solution growth system has been built based on temperature reduction method [1]. A few KDP crystals were grown by the system up to 160×40×38 mm dimensions. Spectrophotometer transmission spectra from (100) planes of the grown crystals show about 86 % transmission in the visible region. XRD analysis, laser damage threshold, and microhardness of the crystals were determined. The etching behavior of surface features of grown KDP single crystals was studied in different etchants. [ABSTRACT FROM AUTHOR] |
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| قاعدة البيانات: |
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