التفاصيل البيبلوغرافية
| العنوان: |
In Situ and High Resolution TEM Studies of Nano-scale Materials. |
| المؤلفون: |
Sinclair, R, Koh, AL, Kempen, P, Jung, HJ |
| المصدر: |
Microscopy & Microanalysis; Jul2009 Supplement 2, Vol. 15 Issue S2, p1200-1201, 2p |
| مستخلص: |
Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009 [ABSTRACT FROM PUBLISHER] |
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| قاعدة البيانات: |
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