دورية أكاديمية

Characterization of photodeposited selenium planar structures by scanning force microscopy.

التفاصيل البيبلوغرافية
العنوان: Characterization of photodeposited selenium planar structures by scanning force microscopy.
المؤلفون: Peled, A., Baranauskas, V., Rodrigues, C., Art-Weisman, D., Grantman, L., Friesem, A. A.
المصدر: Journal of Applied Physics; 6/15/1995, Vol. 77 Issue 12, p6208, 6p, 3 Black and White Photographs, 5 Graphs
مصطلحات موضوعية: SCANNING force microscopy, THIN films, SELENIUM
مستخلص: Presents a study which investigated by scanning force microscopy the photodeposited thin film devices of selenium. Experimental details; Grain structure of the laser deposited film structures; Conclusion.
قاعدة البيانات: Complementary Index
الوصف
تدمد:00218979
DOI:10.1063/1.359149