التفاصيل البيبلوغرافية
العنوان: |
Characterization of photodeposited selenium planar structures by scanning force microscopy. |
المؤلفون: |
Peled, A., Baranauskas, V., Rodrigues, C., Art-Weisman, D., Grantman, L., Friesem, A. A. |
المصدر: |
Journal of Applied Physics; 6/15/1995, Vol. 77 Issue 12, p6208, 6p, 3 Black and White Photographs, 5 Graphs |
مصطلحات موضوعية: |
SCANNING force microscopy, THIN films, SELENIUM |
مستخلص: |
Presents a study which investigated by scanning force microscopy the photodeposited thin film devices of selenium. Experimental details; Grain structure of the laser deposited film structures; Conclusion. |
قاعدة البيانات: |
Complementary Index |