مؤتمر
Impact and optimization of lithography-aware regular layout in digital circuit design.
العنوان: | Impact and optimization of lithography-aware regular layout in digital circuit design. |
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المؤلفون: | Dal Bem, V., Butzen, P., Marranghello, F.S., Reis, A.I., Ribas, R.P. |
المصدر: | 2011 IEEE 29th International Conference on Computer Design (ICCD); 2011, p279-284, 6p |
قاعدة البيانات: | Complementary Index |
ردمك: | 9781457719530 |
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DOI: | 10.1109/ICCD.2011.6081409 |