Flip-chip-integrated silicon nitride ECL at 640nm with relaxed alignment tolerances

التفاصيل البيبلوغرافية
العنوان: Flip-chip-integrated silicon nitride ECL at 640nm with relaxed alignment tolerances
المؤلفون: Reed, Graham T., Knights, Andrew P., Kluge, Ines, Schulten, Michael, Tabatabaei Mashayekh, Alireza, Rodrigo, Rebecca, Ackermann, Manuel, Ghannam, Ibrahim, Stassen, Andim, Merget, Florian, Leisching, Patrick, Witzens, Jeremy
المصدر: Proceedings of SPIE; March 2022, Vol. 12006 Issue: 1 p120060E-120060E-9, 1080550p
قاعدة البيانات: Supplemental Index
الوصف
تدمد:0277786X
DOI:10.1117/12.2607615