A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme

التفاصيل البيبلوغرافية
العنوان: A 1.2V 30nm 3.2Gb/s/pin 4Gb DDR4 SDRAM with dual-error detection and PVT-tolerant data-fetch scheme
المؤلفون: Kyomin Sohn, Taesik Na, Indal Song, Yong Shim, Wonil Bae, Sanghee Kang, Dongsu Lee, Hangyun Jung, Hanki Jeoung, Ki-Won Lee, Junsuk Park, Jongeun Lee, Byunghyun Lee, Inwoo Jun, Juseop Park, Junghwan Park, Hundai Choi, Sanghee Kim, Haeyoung Chung, Young Choi, Dae-Hee Jung, Jang Seok Choi, Byungsick Moon, Jung-Hwan Choi, Byungchul Kim, Seong-Jin Jang, Joo Sun Choi, Kyung Seok Oh
المصدر: 2012 IEEE International Solid-State Circuits Conference.
بيانات النشر: IEEE, 2012.
سنة النشر: 2012
مصطلحات موضوعية: DDR4 SDRAM, Scheme (programming language), Power demand, CMOS, business.industry, Computer science, Fetch, business, Error detection and correction, computer, Computer hardware, Dual (category theory), computer.programming_language
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::067b573eacb4ae8744e734ab6cf63573
https://doi.org/10.1109/isscc.2012.6176868
رقم الأكسشن: edsair.doi...........067b573eacb4ae8744e734ab6cf63573
قاعدة البيانات: OpenAIRE