Pattern-based IP block detection, verification, and variability analysis

التفاصيل البيبلوغرافية
العنوان: Pattern-based IP block detection, verification, and variability analysis
المؤلفون: Muhamad Asraf Bin Ahmad Ibrahim, Philippe Hurat, Ezni Aznida Binti Kamal Baharin, Ya-Chieh Lai, Mohamad Fahmi Bin Muhsain, Jason Sweis
المصدر: Design-Process-Technology Co-optimization for Manufacturability XII.
بيانات النشر: SPIE, 2018.
سنة النشر: 2018
مصطلحات موضوعية: Computer science, business.industry, Embedded system, Next-generation network, Hardware_INTEGRATEDCIRCUITS, Block detection, Pattern analysis, Process window, Design cycle, Tape-out, business, Turnaround time
الوصف: The goal of a foundry partner is to deliver high quality silicon product to its customers on time. There is an assumed trust that the silicon will yield, function and perform as expected when the design fits all the sign-off criteria. The use of Intellectual Property (IP) blocks is very common today and provides the customer with pre-qualified and optimized functions for their design thus shortening the design cycle. There are many methods by which an IP Block can be generated and placed within layout. Even with the most careful methods and following of guidelines comes the responsibility of sign-off checking. A foundry needs to detect where these IP Blocks have been placed and look for any violations. This includes DRC clean modifications to the IP Block which may or may not be intentional. Using a pattern-based approach to detect all IP Blocks used provides the foundry advanced capabilities to analyze them further for any kind of changes which could void the OPC and process window optimizations. Having any changes in an IP Block could cause functionality changes or even failures. This also opens the foundry to legal and cost issues while at the same time forcing re-spins of the design. In this publication, we discuss the methodology we have employed to avoid process issues and tape-out errors while at the same time reduce our manual work and improve the turnaround time. We are also able to use our pattern analysis to improve our OPC optimizations when modifications are encountered which have not been seen before.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::51bb7fba970a0cd3ed8d0c0e125b9b3c
https://doi.org/10.1117/12.2297675
رقم الأكسشن: edsair.doi...........51bb7fba970a0cd3ed8d0c0e125b9b3c
قاعدة البيانات: OpenAIRE