Implementation of the IMEC-Clean in advanced CMOS manufacturing

التفاصيل البيبلوغرافية
العنوان: Implementation of the IMEC-Clean in advanced CMOS manufacturing
المؤلفون: S. Degendt, I. Cornelissen, K. Kenis, Rita Vos, Marc Meuris, M. Lux, S. Arnauts, M.M. Heyns, K. Wolke, I. Teerlinck, Lee M. Loewenstein, Paul Mertens
المصدر: 1999 IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings (Cat No.99CH36314).
بيانات النشر: IEEE, 2003.
سنة النشر: 2003
مصطلحات موضوعية: Materials science, CMOS, business.industry, Etching (microfabrication), Electrical engineering, Optoelectronics, business, Cmos process, Surface cleaning, Line (electrical engineering)
الوصف: We present data measured using the wet bench in the prototyping line of IMEC. This wet bench has been running for 3 years an IMEC Clean for prediffusion cleans including the most critical one: the pre-gate oxidation clean. The clean was introduced at IMEC for the 0.35 /spl mu/m CMOS process and its use has been succesfully extended to the 180 nm and 130 nm CMOS modules presently developed at IMEC.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::91563e47c5adb8ab29838d962a4bc2b0
https://doi.org/10.1109/issm.1999.808761
رقم الأكسشن: edsair.doi...........91563e47c5adb8ab29838d962a4bc2b0
قاعدة البيانات: OpenAIRE