Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention
| العنوان: | Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention |
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| المؤلفون: | Mattia Giulianini, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni |
| المصدر: | 2023 IEEE International Reliability Physics Symposium (IRPS). |
| بيانات النشر: | IEEE, 2023. |
| سنة النشر: | 2023 |
| URL الوصول: | https://explore.openaire.eu/search/publication?articleId=doi_________::91756ce73d3e69e1271b401518d49e2f https://doi.org/10.1109/irps48203.2023.10117584 |
| حقوق: | CLOSED |
| رقم الأكسشن: | edsair.doi...........91756ce73d3e69e1271b401518d49e2f |
| قاعدة البيانات: | OpenAIRE |
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