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Structural and Electronic Characterization of Nanocrystalline Diamondlike Carbon Thin Films

التفاصيل البيبلوغرافية
العنوان: Structural and Electronic Characterization of Nanocrystalline Diamondlike Carbon Thin Films
المؤلفون: Sushil Kumar, Ravi Kant Tripathi, J. D. Carey, Hitendra K. Malik, Neeraj Dwivedi, Manas Kumar Dalai
المصدر: ACS Applied Materials & Interfaces. 4:5309-5316
بيانات النشر: American Chemical Society (ACS), 2012.
سنة النشر: 2012
مصطلحات موضوعية: symbols.namesake, Field electron emission, Carbon film, Materials science, Field emission display, symbols, Analytical chemistry, Infrared spectroscopy, General Materials Science, Thin film, Raman spectroscopy, Nanocrystalline material, Amorphous solid
الوصف: The origin of low threshold field-emission (threshold field 1.25 V/μm) in nanocrystalline diamond-like carbon (nc-DLC) thin films is examined. The introduction of nitrogen and thermal annealing are both observed to change the threshold field and these changes are correlated with changes to the film microstructure. A range of different techniques including micro-Raman and infrared spectroscopy, X-ray diffraction, electron microscopy, energy-dispersive X-ray analysis and time-of-flight-secondary ion mass spectroscopy are used to examine the properties of the films. A comparison of the field emission properties of nc-DLC films with atomically smooth amorphous DLC (a-DLC) films reveals that nc-DLC films have lower threshold fields. Our results show that nc-DLC can be a good candidate for large area field emission display panels and cold cathode emission devices. © 2012 American Chemical Society.
وصف الملف: text
تدمد: 1944-8252
1944-8244
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0fcfae493c990367060fa13202fcb88c
https://doi.org/10.1021/am301252e
حقوق: OPEN
رقم الأكسشن: edsair.doi.dedup.....0fcfae493c990367060fa13202fcb88c
قاعدة البيانات: OpenAIRE
الوصف
تدمد:19448252
19448244