Ti alloyed $\alpha$-Ga$_2$O$_3$: route towards wide band gap engineering

التفاصيل البيبلوغرافية
العنوان: Ti alloyed $\alpha$-Ga$_2$O$_3$: route towards wide band gap engineering
المؤلفون: Barthel, A., Roberts, J. W., Napari, M., Huq, T. N., Kovács, A., Oliver, R. A., Chalker, P. R., Sajavaara, T., Massabuau, F. C-P.
سنة النشر: 2020
المجموعة: Condensed Matter
Physics (Other)
مصطلحات موضوعية: Physics - Applied Physics, Condensed Matter - Materials Science
الوصف: The suitability of Ti as a band gap modifier for $\alpha$-Ga$_2$O$_3$ was investigated, taking advantage of the isostructural {\alpha}-phases and high band gap difference between Ti$_2$O$_3$ and Ga$_2$O$_3$. Films of Ti:Ga$_2$O$_3$, with a range of Ti concentrations, synthesized by atomic layer deposition on sapphire substrates, were characterized to determine how crystallinity and band gap vary with composition for this alloy. The deposition of crystalline $\alpha$-(Ti$_x$Ga$_{1-x}$)$_2$O$_3$ films with up to x~5.3%, was demonstrated. At greater Ti concentration, the films became amorphous. Modification of the band gap over a range of ~ 270 meV was achieved across the crystalline films and a maximum change in band gap from pure $\alpha$-Ga$_2$O$_3$ of ~1.1 eV was observed for the films of greatest Ti fraction (61% Ti relative to Ga). The ability to maintain a crystalline phase at low fractions of Ti, accompanied by a significant modification in band gap shows promise for band gap engineering and the enhancement in versatility of application of $\alpha$-Ga$_2$O$_3$ in optoelectronic devices.
Comment: 12 pages, 5 figures, 1 table
نوع الوثيقة: Working Paper
DOI: 10.3390/mi11121128
URL الوصول: http://arxiv.org/abs/2006.01422
رقم الأكسشن: edsarx.2006.01422
قاعدة البيانات: arXiv