Phonon Scattering Mechanism in Thermoelectric Materials Revised via Resonant X-ray Dynamical Diffraction

التفاصيل البيبلوغرافية
العنوان: Phonon Scattering Mechanism in Thermoelectric Materials Revised via Resonant X-ray Dynamical Diffraction
المؤلفون: Valério, Adriana, Penacchio, Rafaela F. S., Estradiote, Maurício B., Cantarino, Marli R., Garcia, Fernando A., Morelhão, Sérgio L., Rafter, Niamh, Kycia, Stefan W., Calligaris, Guilherme A., Remédios, Cláudio M. R.
المصدر: MRS Communications, 1-7 (2020)
سنة النشر: 2020
المجموعة: Condensed Matter
مصطلحات موضوعية: Condensed Matter - Materials Science
الوصف: Engineering of thermoelectric materials requires an understanding of thermal conduction by lattice and electronic degrees of freedom. Filled skutterudites denote a large family of materials suitable for thermoelectric applications where reduced lattice thermal conduction attributed to localized low-frequency vibrations (rattling) of filler cations inside large cages of the structure. In this work, a multi-wavelength method of exploiting X-ray dynamical diffraction in single crystals of CeFe$_4$P$_{12}$ is presented and applied to resolve the atomic amplitudes of vibrations. The results suggest that the vibrational dynamics of the whole filler-cage system is the actual active mechanism behind the optimization of thermoelectric properties.
Comment: 14 pages, 4 figures
نوع الوثيقة: Working Paper
DOI: 10.1557/mrc.2020.37
URL الوصول: http://arxiv.org/abs/2006.12747
رقم الأكسشن: edsarx.2006.12747
قاعدة البيانات: arXiv