تقرير
Fourier Transform-Based Post-Processing Drift Compensation and Calibration Method for Scanning Probe Microscopy
| العنوان: | Fourier Transform-Based Post-Processing Drift Compensation and Calibration Method for Scanning Probe Microscopy |
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| المؤلفون: | Ster, Maxime Le, Pawłowski, Sławomir, Lutsyk, Iaroslav, Kowalczyk, Paweł Janusz |
| سنة النشر: | 2023 |
| المجموعة: | Condensed Matter Physics (Other) |
| مصطلحات موضوعية: | Physics - Instrumentation and Detectors, Condensed Matter - Mesoscale and Nanoscale Physics |
| الوصف: | Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, wherein a sharp tip rasters the surface during which a physical setpoint is maintained via a control feedback loop, often implies that the image is subject to drift effects, leading to distortion of the resulting image. While there are \emph{in-operando} methods to compensate for the drift, correcting the residual linear drift in obtained images is often neglected. In this paper, we present a reciprocal space-based technique to compensate the linear drift in atomically-resolved scanning probe microscopy images without distinction of the fast and slow scanning directions; furthermore this method does not require the set of SPM images obtained for the different scanning directions. Instead, the compensation is made possible by the a priori knowledge of the lattice parameters. The method can also be used to characterize and calibrate the SPM instrument. Comment: 5 pages, 3 figures (+ 5 pages Supplementary Information) |
| نوع الوثيقة: | Working Paper |
| URL الوصول: | http://arxiv.org/abs/2311.05345 |
| رقم الأكسشن: | edsarx.2311.05345 |
| قاعدة البيانات: | arXiv |
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