دورية أكاديمية
Analysis of thermal-offset drift of a high-resolution current probe using a planar Hall resistance sensor
| العنوان: | Analysis of thermal-offset drift of a high-resolution current probe using a planar Hall resistance sensor |
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| المؤلفون: | N. Lee, J. Kim, D. Lee |
| المصدر: | Journal of Sensors and Sensor Systems, Vol 12, Pp 225-234 (2023) |
| بيانات النشر: | Copernicus Publications, 2023. |
| سنة النشر: | 2023 |
| المجموعة: | LCC:Technology |
| مصطلحات موضوعية: | Technology |
| الوصف: | We developed a pin-type current probe with high sensitivity, targeting electrical-probing printed circuit boards (PCBs). The developed sensor showed good enough characteristics, with 1 mA resolution on current measurements and up to 1 MHz operating frequency for analyzing highly integrated PCBs. During its characterization, however, we experienced a monotonously varying output signal in the time range of a few tens of minutes. We modeled it as the thermal-offset drift, being caused by Joule heating during sensor operation, and showed several solutions for reducing the offset by modifying the planar Hall resistance (PHR) layout and electric operation conditions and applying sensor circuitry with pulse width modulation. |
| نوع الوثيقة: | article |
| وصف الملف: | electronic resource |
| اللغة: | English |
| تدمد: | 2194-8771 2194-878X |
| Relation: | https://jsss.copernicus.org/articles/12/225/2023/jsss-12-225-2023.pdf; https://doaj.org/toc/2194-8771; https://doaj.org/toc/2194-878X |
| DOI: | 10.5194/jsss-12-225-2023 |
| URL الوصول: | https://doaj.org/article/18a2ad11eb9b48e8a3820939a7ae411c |
| رقم الأكسشن: | edsdoj.18a2ad11eb9b48e8a3820939a7ae411c |
| قاعدة البيانات: | Directory of Open Access Journals |
Full Text Finder | تدمد: | 21948771 2194878X |
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| DOI: | 10.5194/jsss-12-225-2023 |