دورية أكاديمية
Van der Waals interfaces in multilayer junctions for ultraviolet photodetection
| العنوان: | Van der Waals interfaces in multilayer junctions for ultraviolet photodetection |
|---|---|
| المؤلفون: | Shihong Xie, Mustaqeem Shiffa, Mujahid Shiffa, Zakhar R. Kudrynskyi, Oleg Makarovskiy, Zakhar D. Kovalyuk, Wenkai Zhu, Kaiyou Wang, Amalia Patanè |
| المصدر: | npj 2D Materials and Applications, Vol 6, Iss 1, Pp 1-9 (2022) |
| بيانات النشر: | Nature Portfolio, 2022. |
| سنة النشر: | 2022 |
| المجموعة: | LCC:Materials of engineering and construction. Mechanics of materials LCC:Chemistry |
| مصطلحات موضوعية: | Materials of engineering and construction. Mechanics of materials, TA401-492, Chemistry, QD1-999 |
| الوصف: | Abstract Developments in semiconductor science have led to the miniaturization and improvement of light detection technologies for many applications. However, traditional pn-junctions or three-dimensional device geometries for detection of ultraviolet (UV) light are still limited by the physical properties of the semiconductors used, such as the small penetration depth of UV light in silicon. Van der Waals (vdW) semiconductors and their pn-junctions can offer an alternative solution due to their optical properties and thin pn-junction region. Here, we report on a multi-layer junction that combines single layer graphene and vdW semiconductors (p-GaSe and n-In2Se3) with strong optical absorption in the UV range. The junctions have broadband spectral response (0.3-1.0 μm) and high photoresponsivity under forward and reverse bias, or without any externally applied voltage. The photoresponse differs from that of a traditional pn-junction diode as it is governed by charge transport across thin layers and light-current conversion at three vdW interfaces (e.g. the graphene/GaSe, GaSe/In2Se3 and In2Se3/graphene interfaces). The type-II band alignment at the GaSe/In2Se3 interface and electric field at the three vdW interfaces are beneficial to suppress carrier recombination for enhanced photoresponsivity (up to ~102 A/W) and detectivity (up to ~1013 Jones), beyond conventional UV-enhanced silicon detection technology. |
| نوع الوثيقة: | article |
| وصف الملف: | electronic resource |
| اللغة: | English |
| تدمد: | 2397-7132 |
| Relation: | https://doaj.org/toc/2397-7132 |
| DOI: | 10.1038/s41699-022-00338-0 |
| URL الوصول: | https://doaj.org/article/1970b3ff92444317bcdc3affaf43acd2 |
| رقم الأكسشن: | edsdoj.1970b3ff92444317bcdc3affaf43acd2 |
| قاعدة البيانات: | Directory of Open Access Journals |
Find this article in full text from Springer Verlag. 
Full Text Finder | تدمد: | 23977132 |
|---|---|
| DOI: | 10.1038/s41699-022-00338-0 |