دورية أكاديمية

Low-pressure micro-silver sintering with the addition of indium for high-temperature power chips attachment

التفاصيل البيبلوغرافية
العنوان: Low-pressure micro-silver sintering with the addition of indium for high-temperature power chips attachment
المؤلفون: Chin-Hao Tsai, Wei-Chen Huang, Ly May Chew, Wolfgang Schmitt, Jiahui Li, Hiroshi Nishikawa, C.R. Kao
المصدر: Journal of Materials Research and Technology, Vol 15, Iss , Pp 4541-4553 (2021)
بيانات النشر: Elsevier, 2021.
سنة النشر: 2021
المجموعة: LCC:Mining engineering. Metallurgy
مصطلحات موضوعية: Interconnection, Die attachment, Micro-Ag sintering, Ag–In intermetallic compounds, Transient liquid phase bonding, Mechanical properties, Mining engineering. Metallurgy, TN1-997
الوصف: Sintered silver paste is a popular material for die attachment technology in power electronics. However, using traditional nano-silver paste when fabricating sintered joints has intrinsic material problems that cannot be overcome, such as the high cost of nano-silver particles and their potential health hazards. In this study, a novel micro-silver paste was utilized for sintering and bonding to overcome the limitations of nano-silver paste. Although the micro-silver paste is an excellent candidate to replace nano-silver paste for sintering processes to reduce the potential harm to humans, the oxidation at copper substrates on both sides of the pure silver joint at 300 °C causes mechanical reliability issues in long-term high temperature applications. Therefore, a micro-silver paste was sintered with the addition of indium to address the Cu oxidation problem in this study. It was found that Ag–In intermetallic compounds (IMCs) formed through a transient liquid phase reaction. The results demonstrated that sintered joints comprising Ag–In IMCs and Ag–In solid solution phases could effectively resolve the oxidation issues and significantly enhance the high-temperature reliability. Furthermore, the Ag–In IMCs exhibited excellent mechanical properties, withstanding the thermal stress induced during the thermal cycling test.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 2238-7854
Relation: http://www.sciencedirect.com/science/article/pii/S2238785421012151; https://doaj.org/toc/2238-7854
DOI: 10.1016/j.jmrt.2021.10.079
URL الوصول: https://doaj.org/article/50ec2105ac7343609efeb9b1e75ff6d0
رقم الأكسشن: edsdoj.50ec2105ac7343609efeb9b1e75ff6d0
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:22387854
DOI:10.1016/j.jmrt.2021.10.079