دورية أكاديمية

Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing

التفاصيل البيبلوغرافية
العنوان: Color Shift Modeling of Light-Emitting Diode Lamps in Step-Loaded Stress Testing
المؤلفون: Miao Cai, Daoguo Yang, Jianlin Huang, Maofen Zhang, Xianping Chen, Caihang Liang, Sau Koh, Guoqi Zhang
المصدر: IEEE Photonics Journal, Vol 9, Iss 1, Pp 1-14 (2017)
بيانات النشر: IEEE, 2017.
سنة النشر: 2017
المجموعة: LCC:Applied optics. Photonics
LCC:Optics. Light
مصطلحات موضوعية: Light-emitting diodes (LEDs), color shift (CS), reliability modeling, degradation mechanism, Applied optics. Photonics, TA1501-1820, Optics. Light, QC350-467
الوصف: The color coordinate shift of light-emitting diode (LED) lamps is investigated by running three stress-loaded testing methods, namely step-up stress accelerated degradation testing, step-down stress accelerated degradation testing, and constant stress accelerated degradation testing. A power model is proposed as the statistical model of the color shift (CS) process of LED products. Consequently, a CS mechanism constant is obtained for detecting the consistency of CS mechanisms among various stress-loaded conditions. A statistical procedure with the proposed power model is then derived for the CS paths of LED lamps in step-loaded stress testing. Two types of commercial LED lamps with different capabilities of heat dissipation (CHDs) are investigated. Results show that the color coordinates of lamps are easily modified in various stress-loaded conditions, and different CHDs of lamps may play a crucial role in the various CS processes. Furthermore, the proposed statistic power model is adequate for the CS process of LED lamps. The consistency of CS mechanisms in step-loaded stress testing can also be detected effectively by applying the proposed statistic procedure with the power model. Moreover, the constant assumption in the model is useful for judging the consistency of CS mechanisms under various stress-loaded conditions.
نوع الوثيقة: article
وصف الملف: electronic resource
اللغة: English
تدمد: 1943-0655
Relation: https://ieeexplore.ieee.org/document/7765031/; https://doaj.org/toc/1943-0655
DOI: 10.1109/JPHOT.2016.2634702
URL الوصول: https://doaj.org/article/abecd97448814a4a8292df8b1b7adf9b
رقم الأكسشن: edsdoj.becd97448814a4a8292df8b1b7adf9b
قاعدة البيانات: Directory of Open Access Journals
الوصف
تدمد:19430655
DOI:10.1109/JPHOT.2016.2634702