مؤتمر
Statistical modeling and analysis of wafer test fail counts
| العنوان: | Statistical modeling and analysis of wafer test fail counts |
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| المؤلفون: | Melzner, H. |
| المصدر: | 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 (Cat. No.02CH37259) Advanced semiconductor manufacturing Advanced Semiconductor Manufacturing 2002 IEEE/SEMI Conference and Workshop. :266-271 2002 |
| Relation: | 13th Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference. Advancing the Science and Technology of Semiconductor Manufacturing. ASMC 2002 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780371585 9780780371583 |
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| DOI: | 10.1109/ASMC.2002.1001616 |