مؤتمر
A Deep Learning Approach to Detect and Classify Wheat Leaf Spot Using Faster R-CNN and Support Vector Machine
| العنوان: | A Deep Learning Approach to Detect and Classify Wheat Leaf Spot Using Faster R-CNN and Support Vector Machine |
|---|---|
| المؤلفون: | Bansal, Ankit, Sharma, Rishabh, Sharma, Vikrant, Jain, Anuj Kumar, Kukreja, Vinay |
| المصدر: | 2023 IEEE 8th International Conference for Convergence in Technology (I2CT) Convergence in Technology (I2CT), 2023 IEEE 8th International Conference for. :1-6 Apr, 2023 |
| Relation: | 2023 IEEE 8th International Conference for Convergence in Technology (I2CT) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
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