Selective Dielectric on Dielectric (DOD) achieved on SiO2 in Preference to Wby 300°C Aniline Passivation and Water-free Chemical Vapor Deposition

التفاصيل البيبلوغرافية
العنوان: Selective Dielectric on Dielectric (DOD) achieved on SiO2 in Preference to Wby 300°C Aniline Passivation and Water-free Chemical Vapor Deposition
المؤلفون: Kummel, Andrew C.
المصدر: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT) Technology, Systems and Applications (VLSI-TSA/VLSI-DAT), 2023 International VLSI Symposium on. :1-1 Apr, 2023
Relation: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT)
قاعدة البيانات: IEEE Xplore Digital Library