Improving uniformity of 3-level High Aspect Ratio Supervias

التفاصيل البيبلوغرافية
العنوان: Improving uniformity of 3-level High Aspect Ratio Supervias
المؤلفون: Montero, D., Marien, P., Hermans, Y., Vega-Gonzalez, V., Feurprier, Y., Oikawa, N., Buccheri, N., Wu, C., Martinez, G.T., Batuk, D., Puliyalil, H., Decoster, S., Kumar, K., Lazzarino, F., Murdoch, G., Park, S., Tokei, Z.
المصدر: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM) Advanced Metallization Conference (MAM)(IITC/MAM), 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for. :1-3 May, 2023
Relation: 2023 IEEE International Interconnect Technology Conference (IITC) and IEEE Materials for Advanced Metallization Conference (MAM)(IITC/MAM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9798350310979
تدمد:23806338
DOI:10.1109/IITC/MAM57687.2023.10154787