Scenario-Based Approach to Systematically Derive Test Cases for Systems

التفاصيل البيبلوغرافية
العنوان: Scenario-Based Approach to Systematically Derive Test Cases for Systems
المؤلفون: Nyakundi, Nicholas B. N., Reynolds, Shawn M., Reza, Hassan
المصدر: 2023 IEEE International Conference on Electro Information Technology (eIT) Electro Information Technology (eIT), 2023 IEEE International Conference on. :051-058 May, 2023
Relation: 2023 IEEE International Conference on Electro Information Technology (eIT)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781665493765
تدمد:21540373
DOI:10.1109/eIT57321.2023.10187246