مؤتمر
Testing dielectric slab mode excitation, non-rectangular conductor profiles and edge roughness as sources of additional loss in mmWave transmission lines
العنوان: | Testing dielectric slab mode excitation, non-rectangular conductor profiles and edge roughness as sources of additional loss in mmWave transmission lines |
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المؤلفون: | Bergmann, F., Jungwirth, N., Bosworth, B., Killgore, J., Marksz, E., Karpisz, T., Papac, M., Osella, A., Enright, L., Long, C. J., Orloff, N. D. |
المصدر: | 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023 Microwave Symposium - IMS 2023, 2023 IEEE/MTT-S International. :366-369 Jun, 2023 |
Relation: | 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023 |
قاعدة البيانات: | IEEE Xplore Digital Library |
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