مؤتمر
Thermal Evaluation of 28-nm p-type FD-SOI MOSFETs
| العنوان: | Thermal Evaluation of 28-nm p-type FD-SOI MOSFETs |
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| المؤلفون: | Rossetto, Alan, Soares, Caroline, Wirth, Gilson, Pavanello, Marcelo, Wang, Ziyi, Vasileska, Dragica |
| المصدر: | 2023 IEEE Latin American Electron Devices Conference (LAEDC) Electron Devices Conference (LAEDC), 2023 IEEE Latin American. :1-4 Jul, 2023 |
| Relation: | 2023 IEEE Latin American Electron Devices Conference (LAEDC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350311907 |
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| تدمد: | 28353471 |
| DOI: | 10.1109/LAEDC58183.2023.10209116 |