مؤتمر
Reliability Evaluation of Hot Carrier Injection Effects on MOSFET Devices
| العنوان: | Reliability Evaluation of Hot Carrier Injection Effects on MOSFET Devices |
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| المؤلفون: | Youhanis, H. A., Abdul Hadi, M. F., Hussin, H., Muhamad, M., Aziz, A. Abdul, Wahab, Y. Abdul |
| المصدر: | 2023 5th International Conference on Inventive Research in Computing Applications (ICIRCA) Inventive Research in Computing Applications (ICIRCA), 2023 5th International Conference on. :1505-1511 Aug, 2023 |
| Relation: | 2023 5th International Conference on Inventive Research in Computing Applications (ICIRCA) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
| ردمك: | 9798350321425 9798350321418 |
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| DOI: | 10.1109/ICIRCA57980.2023.10220658 |