Breakdown Thresholds Prediction for Microwave Devices with Pulsed Excitation and Temperature Effects

التفاصيل البيبلوغرافية
العنوان: Breakdown Thresholds Prediction for Microwave Devices with Pulsed Excitation and Temperature Effects
المؤلفون: Liu, Fangchen, Qin, Haoran, Zhang, Tiancheng, Bao, Huaguang, Ding, Dazhi
المصدر: 2023 International Applied Computational Electromagnetics Society Symposium (ACES-China) Applied Computational Electromagnetics Society Symposium (ACES-China), 2023 International. :1-3 Aug, 2023
Relation: 2023 International Applied Computational Electromagnetics Society Symposium (ACES-China)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781733509657
DOI:10.23919/ACES-China60289.2023.10249706