مؤتمر
STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes
| العنوان: | STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes |
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| المؤلفون: | Garcia-Redondo, F., Rao, S., Gupta, M., Perumkunnil, M., Xiang, Y., Abdi, D., Van Beek, S., Couet, S., Garcia-Bardon, M. |
| المصدر: | ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :97-100 Sep, 2023 |
| Relation: | ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9798350304237 9798350304220 |
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| تدمد: | 23786558 |
| DOI: | 10.1109/ESSDERC59256.2023.10268481 |