مؤتمر
STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes
العنوان: | STT-MRAM Stochastic and Defects-aware DTCO for Last Level Cache at Advanced Process Nodes |
---|---|
المؤلفون: | Garcia-Redondo, F., Rao, S., Gupta, M., Perumkunnil, M., Xiang, Y., Abdi, D., Van Beek, S., Couet, S., Garcia-Bardon, M. |
المصدر: | ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) Solid-State Device Research Conference (ESSDERC), ESSDERC 2023 - IEEE 53rd European. :97-100 Sep, 2023 |
Relation: | ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
كن أول من يترك تعليقا!